OP27(2002) 데이터 시트보기 (PDF) - Analog Devices
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OP27 Datasheet PDF : 16 Pages
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OP27–SPECIFICATIONS
ELECTRICAL CHARACTERISTICS (@ VS = ±15 V, TA = 25؇C, unless otherwise noted.)
Parameter
Symbol Conditions
OP27A/E
Min Typ Max
INPUT OFFSET
VOLTAGE1
VOS
10 25
LONG-TERM VOS
STABILITY2, 3
VOS/Time
0.2 1.0
INPUT OFFSET
CURRENT
IOS
7
35
INPUT BIAS
CURRENT
INPUT NOISE
VOLTAGE3, 4
IB
en p-p
0.1 Hz to 10 Hz
± 10 ± 40
0.08 0.18
INPUT NOISE
en
Voltage Density3
fO = 10 Hz
fO = 30 Hz
fO = 1000 Hz
3.5 5.5
3.1 4.5
3.0 3.8
INPUT NOISE
in
Current Density3, 5
fO = 10 Hz
fO = 30 Hz
fO = 1000 Hz
1.7 4.0
1.0 2.3
0.4 0.6
INPUT
RESISTANCE
Differential-Mode6
Common-Mode
RIN
RINCM
1.3 6
3
INPUT VOLTAGE
RANGE
IVR
± 11.0 ± 12.3
COMMON-MODE
REJECTION RATIO CMRR VCM = ± 11 V
114 126
POWER SUPPLY
PSRR
REJECTION RATIO
VS = ± 4 V
to ± 18 V
1
10
LARGE-SIGNAL
AVO
VOLTAGE GAIN
OUTPUT
VOLTAGE SWING VO
SLEW RATE7
SR
RL ≥ 2 kΩ,
VO = ± 10 V
RL ≥ 600 Ω,
VO = ± 10 V
RL ≥ 2 kΩ
RL ≥ 600 Ω
RL ≥ 2 kΩ
1000 1800
800 1500
± 12.0 ± 13.8
± 10.0 ± 11.5
1.7 2.8
OP27F
Min Typ Max
20 60
0.3 1.5
9
50
± 12 ± 55
0.08 0.18
3.5 5.5
3.1 4.5
3.0 3.8
1.7 4.0
1.0 2.3
0.4 0.6
0.94 5
2.5
± 11.0 ± 12.3
106 123
1
10
1000 1800
800 1500
± 12.0 ± 13.8
± 10.0 ± 11.5
1.7 2.8
OP27C/G
Min Typ Max
30 100
0.4 2.0
12 75
± 15 ± 80
0.09 0.25
3.8 8.0
3.3 5.6
3.2 4.5
1.7
1.0
0.4 0.6
0.7 4
2
± 11.0 ± 12.3
100 120
2
20
700 1500
600 1500
± 11.5 ± 13.5
± 10.0 ± 11.5
1.7 2.8
Unit
µV
µV/MO
nA
nA
µV p-p
nV/√Hz
nV/√Hz
nV/√Hz
pA/√Hz
pA/√Hz
pA/√Hz
MΩ
GΩ
V
dB
µV/V
V/mV
V/mV
V
V
V/µs
GAIN
BANDWIDTH
PRODUCT7
GBW
5.0 8.0
5.0 8.0
5.0 8.0
MHz
OPEN-LOOP
OUTPUT
RESISTANCE
RO
POWER
CONSUMPTION
Pd
OFFSET
ADJUSTMENT
RANGE
VO = 0, IO = 0
VO
RP = 10 kΩ
70
90 140
± 4.0
70
90 140
± 4.0
70
Ω
100 170 mW
± 4.0
mV
NOTES
1Input offset voltage measurements are performed ~ 0.5 seconds after application of power. A/E grades guaranteed fully warmed up.
2Long-term input offset voltage stability refers to the average trend line of VOS versus. Time over extended periods after the first 30 days of operation. Excluding the
initial hour of operation, changes in VOS during the first 30 days are typically 2.5 µV. Refer to typical performance curve.
3Sample tested.
4See test circuit and frequency response curve for 0.1 Hz to 10 Hz tester.
5See test circuit for current noise measurement.
6Guaranteed by input bias current.
7Guaranteed by design.
–2–
REV. A
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