Test Circuits
ADG786/ADG788
IDS
V1
S
D
VS
RON = V1/IDS
Test Circuit 1. On Resistance
IS (OFF)
A
S
D
VS
VD
Test Circuit 2. IS (OFF)
S
NC
ID (ON)
D
A
VD
NC = NO CONNECT
Test Circuit 3. ID (ON)
VDD
0.1F
VS1B
VS1A
VDD
S1B
D1
S1A
IN/EN
RL
300⍀
VOUT
CL
35pF
ADDRESS
DRIVE
VS1A
VOUT
VS1B
50%
90%
50%
90%
GND VSS
0.1F
tON
tOFF
VIN
VIN
VSS
Test Circuit 4. Switching Times, tON, tOFF
VDD
VSS
0.1F
3V
VDD
VSS
A2
S1A
VS
A1
A0
S1B
ADG786
50⍀
EN
D1
GND
RL
300⍀
CL VO
35pF
ENABLE
DRIVE (VIN)
0V
VO
OUTPUT
50%
50%
0.9V0
0V
tON(EN)
Test Circuit 5. Enable Delay, tON (EN), tOFF (EN)
VDD
0.1F
3V
VDD
ADDRESS* SA
VS
50⍀
SB
ADG786/
ADG788
GND
D1
VSS
RL
300⍀
VOUT
CL
35pF
0.1F
VSS
*A0, A1, A2 for ADG786, IN1-4 for ADG788
ADDRESS
0V
VS
VOUT
80%
80%
tOPEN
Test Circuit 6. Break-Before-Make Delay, tOPEN
tOFF( EN)
0.9V0
REV. A
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