ADIS16240ABCZ(Rev0) 데이터 시트보기 (PDF) - Analog Devices

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ADIS16240ABCZ
(Rev.:Rev0)

Low Power, Programmable Impact Sensor and Recorder

Analog Devices 

ADIS16240

SPECIFICATIONS

TA = 25°C, VDD = 2.4 V to 3.6 V unless otherwise noted.

Table 1.

Parameter

ACCELEROMETER

Dynamic Range

Initial Sensitivity

Sensitivity Temperature Coefficient

Sensitivity Change with Supply Voltage

Nonlinearity

Sensor-to-Sensor Alignment Error

Cross-Axis Sensitivity

Initial Bias Error

Bias Temperature Coefficient

Bias Voltage Sensitivity

Output Noise

Noise Density

Bandwidth

Sensor Resonant Frequency

Self-Test Change in Output Response

TEMPERATURE SENSOR SCALE FACTOR

ADC INPUT

Input Range

Resolution

Integral Nonlinearity, INL

Differential Nonlinearity, DNL

Offset Error

Gain Error

Input Capacitance

LOGIC INPUTS1

Input High Voltage, VINH

Input Low Voltage, VINL

Logic 1 Input Current, IINH

Logic 0 Input Current, IINL

Input Capacitance, CIN

DIGITAL OUTPUTS

Output High Voltage, VOH

Output Low Voltage, VOL

START-UP TIME

Initial, Reset Recovery

FLASH MEMORY

Endurance2

Data Retention3

CONVERSION RATE SETTING

POWER SUPPLY

Average Supply Current4

Sleep Mode Current

Conditions

−40°C to +85°C

2.4 V < VDD < 3.6 V

Compare with best fit line

No external capacitance

No external capacitance

TEMP_OUT = 0x0133 (307) at 25°C

VIH = VDD

VIL = 0 V

ISOURCE = 1.6 mA

ISINK = 1.6 mA

TJ = 85°C

SMPL_PRD = 0x1F, VDD = 2.5 V

Axis Min

±16

X, Y

−2.7

X, Y

Z

X

−10

Y

+10

Z

+10

0

2.0

2.4

Typ

±19

51.4

±0.01

6

±2

±0.1

±1

±1

TBD

24

480

1600

550

5.5

−21

+21

+36

0.244

10

±1

±1

±1

±1

11

±0.2

−40

10

10,000

20

2.4

1

100

Max

+2.7

−39

+39

+65

VDD

±2

±1.25

±2

±3

0.8

±1

−60

0.4

32

4096

3.6

Unit

g

mg/LSB

%

%

% FS

Degrees

%

g

mg/°C

mg/V

mg rms

μg/√Hz

Hz

Hz

kHz

LSB

LSB

LSB

°C/LSB

V

Bits

LSB

LSB

LSB

LSB

pF

V

V

μA

μA

pF

V

V

ms

Cycles

Years

SPS

V

mA

μA

1 Note that the inputs are 5 V tolerant.

2 Endurance is qualified as per JEDEC Standard 22, Method A117 and measured at −40°C, +25°C, +85°C, and +105°C.

3 Retention lifetime equivalent at junction temperature (TJ) of 55°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.

4 Instantaneous current has periodic peaks at the sample rate that can reach 30 mA.

Rev. 0 | Page 3 of 16

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