M28256-25NS1T(1999) 데이터 시트보기 (PDF) - STMicroelectronics

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M28256-25NS1T
(Rev.:1999)

256 Kbit (32K x 8) Parallel EEPROM With Software Data Protection

STMicroelectronics 

M28256

Table 4. AC Measurement Conditions

Input Rise and Fall Times

Input Pulse Voltages (M28256)

Input Pulse Voltages (M28256-W)

Input and Output Timing Ref. Voltages (M28256)

Input and Output Timing Ref. Voltages (M28256-W)

≤ 20ns

0.4V to 2.4V

0V to VCC –0.3V

0.8V to 2.0V

0.5 VCC

Figure 7. AC Testing Input Output Waveforms

4.5V to 5.5V Operating Voltage

2.4V

0.4V

2.0V

0.8V

2.7V to 3.6V Operating Voltage

VCC – 0.3V

0V

0.5 VCC

AI02101B

Figure 8. AC Testing Equivalent Load Circuit

IOL

DEVICE

UNDER

TEST

IOH

CL includes JIG capacitance

OUT

CL = 100pF

AI02102B

Table 5. Capacitance (1) (TA = 25 °C, f = 1 MHz )

Symbol

Parameter

Test Condition

Min

CIN

Input Capacitance

VIN = 0V

COUT

Output Capacitance

VOUT = 0V

Note: 1. Sampled only, not 100% tested.

Table 6. Read Mode DC Characteristics for M28256

(TA = 0 to 70°C or –40 to 85°C; VCC = 4.5V to 5.5V)

Symbol

Parameter

Test Condition

Min

ILI

ILO

ICC (1)

ICC1 (1)

ICC2 (1)

Input Leakage Current

Output Leakage Current

Supply Current (TTL inputs)

Supply Current (CMOS inputs)

Supply Current (Standby) TTL

Supply Current (Standby) CMOS

0V ≤ VIN ≤ VCC

0V ≤ VIN ≤ VCC

E = VIL, G = VIL , f = 5 MHz

E = VIL, G = VIL , f = 5 MHz

E = VIH

E > VCC –0.3V

VIL

Input Low Voltage

VIH Input High Voltage

– 0.3

2

VOL Output Low Voltage

VOH Output High Voltage

Note: 1. All I/O’s open circuit.

IOL = 2.1 mA

IOH = –400 µA

2.4

Max

6

12

Unit

pF

pF

Max

Unit

10

µA

10

µA

30

mA

25

mA

1

mA

100

µA

0.8

V

VCC + 0.5

V

0.4

V

7/21

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