AM27C040-150DI 데이터 시트보기 (PDF) - Advanced Micro Devices

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AM27C040-150DI

4 Megabit (512 K x 8-Bit) CMOS EPROM

Advanced Micro Devices 

TEST CONDITIONS

FINAL

Device

Under

Test

5.0 V

2.7 kΩ

CL

6.2 kΩ

Note:

Diodes are IN3064 or equivalents.

Figure 1. Test Setup

14971G-5

Table 1. Test Specifications

Test Condition

All

Unit

Output Load

1 TTL gate

Output Load Capacitance, CL

(including jig capacitance)

100

pF

Input Rise and Fall Times

≤ 20

ns

Input Pulse Levels

0.45–2.4

V

Input timing measurement reference

levels

0.8, 2.0

V

Output timing measurement

reference levels

0.8, 2.0

V

SWITCHING TEST WAVEFORM

3V

1.5 V

0V

Input

Note: For CL = 30 pF.

Test Points

1.5 V

Output

2.4 V

0.45 V

2.0 V

2.0 V

Test Points

0.8 V

0.8 V

Input

Output

Note: For CL = 100 pF.

14971G-6

KEY TO SWITCHING WAVEFORMS

WAVEFORM

INPUTS

Steady

OUTPUTS

Changing from H to L

Changing from L to H

Don’t Care, Any Change Permitted

Changing, State Unknown

Does Not Apply

Center Line is High Impedance State (High Z)

KS000010-PAL

Am27C040

9

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