AT24C512B 데이터 시트보기 (PDF) - Atmel Corporation

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AT24C512B

Two-wire Serial EEPROM 512K (65,536 x 8)

Atmel Corporation 

2. Memory Organization

AT24C512B, 512K SERIAL EEPROM: The 512K is internally organized as 512 pages of 128-bytes each. Random word

addressing requires a 16-bit data word address.

Table 2-1. Pin Capacitance(1)

Applicable over recommended operating range from: TA = 25°C, f = 1.0 MHz, VCC = +1.8V to +5.5V

Symbol Test Condition

Max

Units

CI/O

CIN

Note:

Input/Output Capacitance (SDA)

Input Capacitance (A0, A1, SCL)

1. This parameter is characterized and is not 100% tested.

8

pF

6

pF

Conditions

VI/O = 0V

VIN = 0V

Table 2-2. DC Characteristics

Applicable over recommended operating range from: TAI = –40°C to +85°C, VCC = +1.8V to +5.5V (unless otherwise noted)

Symbol Parameter

Test Condition

Min

Typ

Max

Units

VCC1

Supply Voltage

1.8

3.6

V

VCC2

Supply Voltage

2.5

5.5

V

ICC

Supply Current

VCC = 5.0V

READ at 400 kHz

2.0

mA

ICC

Supply Current

VCC = 5.0V

WRITE at 400 kHz

3.0

mA

ISB1

Standby Current

VCC = 1.8V

VCC = 3.6V

VIN = VCC or VSS

1.0

µA

3.0

µA

ISB2

Standby Current

VCC = 2.5V

VCC = 5.5V

VIN = VCC or VSS

2.0

µA

6.0

µA

ILI

Input Leakage Current VIN = VCC or VSS

0.10

3.0

µA

ILO

Output Leakage

Current

VOUT = VCC or VSS

0.05

3.0

µA

VIL

Input Low Level(1)

VIH

Input High Level(1)

–0.6

VCC x 0.7

VCC x 0.3

V

VCC + 0.5

V

VOL1

Output Low Level

VCC = 1.8V

IOL = 0.15 mA

0.2

V

VOL2

Output Low Level

VCC = 3.0V

IOL = 2.1 mA

Note: 1. VIL min and VIH max are reference only and are not tested.

0.4

V

4 AT24C512B

5297A–SEEPR–1/08

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