AT28C040-20BI 데이터 시트보기 (PDF) - Atmel Corporation
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AT28C040-20BI Datasheet PDF : 12 Pages
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AC Read Characteristics
Symbol
tACC
tCE(1)
tOE(2)
tDF(3)(4)
tOH
Parameter
Address to Output Delay
CE to Output Delay
OE to Output Delay
CE or OE to Output Float
Output Hold from OE, CE or Address, whichever occurred first
AC Read Waveforms(1)(2)(3)(4)
AT28C040
AT28C040-20
Min
Max
200
200
0
55
0
55
0
AT28C040-25
Min
Max
250
250
0
55
0
55
0
Units
ns
ns
ns
ns
ns
Note:
1. CE May be delayed up to tACC - tCE after the address transition wihtout impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC.
3. tDF is specified from OE or CE, whichever occurs first (CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Input Test Waveforms and
Measurement Level
Output Test Load
tR, tF < 5 ns
Pin Capacitance
f = 1 MHz, T = 25°C(1)
Typ
Max
CIN
4
10
COUT
8
12
Note: 1. This parameter is characterized and is not 100% tested.
Units
pF
pF
Conditions
VIN = 0V
VOUT = 0V
5
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