AT28HC256N 데이터 시트보기 (PDF) - Atmel Corporation
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AT28HC256N Datasheet PDF : 13 Pages
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AC Read Characteristics
Symbol
tACC
tCE(1)
tOE(2)
tDF(3)(4)
tOH
Parameter
Address to Output Delay
CE to Output Delay
OE to Output Delay
CE or OE to Output Float
Output Hold from OE, CE or Address,
whichever occurred first
AC Read Waveforms(1)(2)(3)(4)
AT28C256N-90
Min
Max
90
90
0
40
0
40
0
AT28HC256N-12
Min
Max
120
120
0
50
0
50
0
Units
ns
ns
ns
ns
ns
tCE
tOE
tACC
tDF
tOH
Notes:
1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC.
3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Input Test Waveforms and Measurement Level
Output Test Load
tR, tF < 5 ns
Pin Capacitance
f = 1 MHz, T = 25°C(1)
Symbol
Typ
Max
CIN
COUT
Note:
4
6
8
12
1. This parameter is characterized and is not 100% tested.
6 AT28HC256N
Units
pF
pF
Conditions
VIN = 0V
VOUT = 0V
3446B–PEEPR–4/04
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