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AT29C512-70PC 데이터 시트보기 (PDF) - Atmel Corporation

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AT29C512-70PC
Atmel
Atmel Corporation Atmel
AT29C512-70PC Datasheet PDF : 18 Pages
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DATA POLLING: The AT29C512 features DATA polling to indicate the end of a program
cycle. During a program cycle an attempted read of the last byte loaded will result in the com-
plement of the loaded data on I/O7. Once the program cycle has been completed, true data is
valid on all outputs and the next cycle may begin. DATA polling may begin at any time during
the program cycle.
TOGGLE BIT: In addition to DATA polling the AT29C512 provides another method for deter-
mining the end of a program or erase cycle. During a program or erase operation, successive
attempts to read data from the device will result in I/O6 toggling between one and zero. Once
the program cycle has completed, I/O6 will stop toggling and valid data will be read. Examin-
ing the toggle bit may begin at any time during a program cycle.
OPTIONAL CHIP ERASE MODE: The entire device can be erased by using a 6-byte soft-
ware code. Please see Software Chip Erase application note for details.
Absolute Maximum Ratings*
Temperature Under Bias................................ -55°C to +125°C
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to VCC + 0.6V
Voltage on OE
with Respect to Ground ...................................-0.6V to +13.5V
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
4 AT29C512
0456F–FLASH–12/02

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