CAT24C04(2010) 데이터 시트보기 (PDF) - ON Semiconductor
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CAT24C04 Datasheet PDF : 16 Pages
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CAT24C01, CAT24C02, CAT24C04, CAT24C08, CAT24C16
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Ratings
Units
Storage Temperature
−65 to +150
°C
Voltage on any pin with respect to Ground (Note 1)
−0.5 to +6.5
V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. During input transitions, voltage undershoot on any pin should not exceed −1 V for more than 20 ns. Voltage overshoot on pins A0, A1, A2
and WP should not exceed VCC + 1 V for more than 20 ns, while voltage on the I2C bus pins, SCL and SDA, should not exceed the absolute
maximum ratings, irrespective of VCC.
Table 2. RELIABILITY CHARACTERISTICS (Note 2)
Symbol
Parameter
Min
Units
NEND (Note 3)
Endurance
1,000,000
Program / Erase Cycles
TDR
Data Retention
100
Years
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
3. Page Mode, VCC = 5 V, 25°C.
Table 3. D.C. OPERATING CHARACTERISTICS
(VCC = 1.8 V to 5.5 V, TA = −40°C to +125°C and VCC = 1.7 V to 5.5 V, TA = −40°C to +85°C, unless otherwise specified.)
Symbol
Parameter
Test Conditions
Min
Max
ICCR Read Current
Read, fSCL = 400 kHz
1
ICCW Write Current
Write, fSCL = 400 kHz
2
ISB
Standby Current
I/O Pins at GND or VCC, VCC < 3.6 V, TA < 85°C
1
I/O Pins at GND or VCC, TA < 125°C
2
IL
I/O Pin Leakage
Pin at GND or VCC
2
VIL
Input Low Voltage
VIH
Input High Voltage
VOL
Output Low Voltage
A0, A1, A2 and WP
SCL and SDA
VCC > 2.5 V, IOL = 3 mA
VCC < 2.5 V, IOL = 1 mA
−0.5
0.7 x VCC
0.7 x VCC
0.3 x VCC
VCC + 0.5
5.5
0.4
0.2
Units
mA
mA
mA
mA
V
V
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