CAT24C03LI-G 데이터 시트보기 (PDF) - ON Semiconductor

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CAT24C03LI-G

2-Kb and 4-Kb I2C Serial EEPROM with Partial Array Write Protection

ON Semiconductor 

CAT24C03, CAT24C05

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Storage Temperature

−65 to +150

°C

Voltage on any pin with respect to Ground (Note 1)

−0.5 to +6.5

V

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may

undershoot to no less than −1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns.

Table 2. RELIABILITY CHARACTERISTICS (Note 2)

Symbol

Parameter

Min

Units

NEND (Note 3)

Endurance

1,000,000

Program / Erase Cycles

TDR

Data Retention

100

Years

2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.

3. Page Mode, VCC = 5 V, 25°C.

Table 3. D.C. OPERATING CHARACTERISTICS

(VCC = 1.8 V to 5.5 V, TA = −40°C to +85°C, unless otherwise specified.)

Symbol

Parameter

Test Conditions

ICCR

ICCW

ISB

IL

VIL

VIH

VOL1

VOL2

Read Current

Write Current

Standby Current

I/O Pin Leakage

Input Low Voltage

Input High Voltage

Output Low Voltage

Output Low Voltage

Read, fSCL = 400 kHz

Write, fSCL = 400 kHz

All I/O Pins at GND or VCC

Pin at GND or VCC

VCC ≥ 2.5 V, IOL = 3 mA

VCC < 2.5 V, IOL = 1 mA

Min

−0.5

VCC x 0.7

Max

1

1

1

1

VCC x 0.3

VCC + 0.5

0.4

0.2

Units

mA

mA

mA

mA

V

V

V

V

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