CAT93C66 데이터 시트보기 (PDF) - ON Semiconductor
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CAT93C66 Datasheet PDF : 16 Pages
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CAT93C66, CAT93W66
Table 9. A.C. CHARACTERISTICS − MATURE PRODUCT
(VCC = +1.8 V to +5.5 V, TA = −40°C to +125°C, unless otherwise specified.) (Note 8)
Limits
Symbol
Parameter
Min
Max
Units
tCSS
CS Setup Time
50
ns
tCSH
CS Hold Time
0
ns
tDIS
DI Setup Time
100
ns
tDIH
DI Hold Time
100
ns
tPD1
Output Delay to 1
0.25
ms
tPD0
Output Delay to 0
0.25
ms
tHZ (Note 9)
Output Delay to High−Z
100
ns
tEW
Program/Erase Pulse Width
5
ms
tCSMIN
Minimum CS Low Time
0.25
ms
tSKHI
Minimum SK High Time
0.25
ms
tSKLOW
Minimum SK Low Time
0.25
ms
tSV
Output Delay to Status Valid
0.25
ms
SKMAX
Maximum Clock Frequency
DC
2000
kHz
8. Test conditions according to “A.C. Test Conditions” table.
9. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate
AEC−Q100 and JEDEC test methods.
Table 10. A.C. CHARACTERISTICS − NEW PRODUCT (Rev H)
(VCC = +1.8 V to +5.5 V, TA = −40°C to +125°C, unless otherwise specified.)
VCC = 1.8 V − 5.5 V
Symbol
Parameter
Min
Max
tCSS
CS Setup Time
50
tCSH
CS Hold Time
0
tDIS
DI Setup Time
100
tDIH
DI Hold Time
100
tPD1
Output Delay to 1
0.25
tPD0
Output Delay to 0
0.25
tHZ (Note 10) Output Delay to High−Z
100
tEW
Program/Erase Pulse Width
5
tCSMIN
Minimum CS Low Time
0.25
tSKHI
Minimum SK High Time
0.25
tSKLOW
Minimum SK Low Time
0.25
tSV
Output Delay to Status Valid
0.25
SKMAX
Maximum Clock Frequency
DC
2000
10. This parameter is tested initially and after a design or process change that affects the parameter.
VCC = 4.5 V − 5.5 V
Min
Max
50
0
50
50
0.1
0.1
100
5
0.1
0.1
0.1
0.1
DC
4000
Units
ns
ns
ns
ns
ms
ms
ns
ms
ms
ms
ms
ms
kHz
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