DS1040-B50 데이터 시트보기 (PDF) - Dallas Semiconductor -> Maxim Integrated

부품명

상세내역

제조사

DS1040-B50

Programmable One-Shot Pulse Generator

Dallas Semiconductor -> Maxim Integrated 

DS1040

tRISE (Input Rise Time): The elapsed time between the 20% and the 80% point on the leading edge of

the input pulse.

tFALL (Input Fall Time): The elapsed time between the 80% and the 20% point on the trailing edge of

the input pulse.

tD (Intrinsic Delay): The elapsed time between the 1.5 point on the leading edge of the input trigger

pulse and the 1.5V point on the leading edge of output pulse.

tPU (Power-up Time): After VCC is valid, the time required before timing specifications is within

tolerance.

TEST SETUP DESCRIPTION

Figure 4 illustrates the hardware configuration used for measuring the timing parameters on the DS1040.

The input waveform is produced by a precision pulse generator under software control. The intrinsic

delay is measured by a time interval counter (20 ps resolution) connected between the input and each

output. Outputs are selected and connected to the counter by a VHF switch control unit. Width

measurements are made by directing both the start and stop functions of the counter to the same output.

All measurements are fully automated, with each instrument controlled by a central computer over an

IEEE 488 bus.

TEST CONDITIONS

Input:

Ambient Temperature:

Supply Voltage (VCC):

Input Pulse:

Source Impedance:

Rise and Fall Time:

25°C + 3°C

5.0V + 0.1V

High = 3.0V + 0.1V

Low = 0.0V + 0.1

50 ohm max.

3.0 ns max. (measured

between 0.6V and 2.4)

Pulse Width:

Period:

500 ns (1 µs for -500)

1 µs (2 µs for -500)

Output:

The output is loaded with a 74F04. Delay is measured at the 1.5V level on the rising and falling edge.

Note:

Above conditions are for test only and do not restrict the operation of the device under other data sheet

conditions.

6 of 6

Share Link: