6N135M 데이터 시트보기 (PDF) - Fairchild Semiconductor
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6N135M Datasheet PDF : 13 Pages
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PRELIMINARY
Absolute Maximum Ratings (TA = 25°C unless otherwise specified)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Condition
TSTG
TOPR
TSOL
Storage Temperature
Operating Temperature
Lead Solder Temperature
(Wave)
EMITTER
IF (avg) DC/Average Forward Input
Current Each Channel(1)
IF (pk) Peak Forward Input Current
Each Channel(2)
50% duty cycle, 1ms P.W.
IF (trans) Peak Transient Input Current ≤1µs P.W., 300pps
Each Channel
VR Reverse Input Voltage Each
Channel
PD Input Power Dissipation Each 6N135M, 6N136M, HCPL2503M,
Channel
HCPL4502M, HCPL4503M
HCPL2530M, HCPL2531M(3)
DETECTOR
IO (avg) Average Output Current Each
Channel
IO (pk) Peak Output Current Each
Channel
VEBR
VCC
VO
IB
PD
Emitter-Base Reverse Voltage
Supply Voltage
Output Voltage
Base Current
Output Power Dissipation
Each Channel
6N135M, 6N136M and HCPL2503M only
6N135M, 6N136M and HCPL2503M only
6N135M, 6N136M, HCPL2503M,
HCPL4502M, HCPL4503M(4)
HCPL2530M, HCPL2531M
Value
-40 to +125
-40 to +100
260 for 10 sec
25
50
1.0
5
100
45
8
16
5
-0.5 to 30
-0.5 to 20
5
100
35
Units
°C
°C
°C
mA
mA
A
V
mW
mA
mA
V
V
V
mA
mW
mW
Notes:
1. Derate linearly above 70°C free-air temperature at a rate of 0.8mA/°C.
2. Derate linearly above 70°C free-air temperature at a rate of 1.6mA/°C.
3. Derate linearly above 70°C free-air temperature at a rate of 0.9 mW/°C.
4. Derate linearly above 70°C free-air temperature at a rate of 2.0 mW/°C.
©2008 Fairchild Semiconductor Corporation
6N13XM, HCPLXXXM Rev. 1.0.1
2
www.fairchildsemi.com
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