HEF4027B(2008) 데이터 시트보기 (PDF) - NXP Semiconductors.
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HEF4027B Datasheet PDF : 13 Pages
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NXP Semiconductors
HEF4027B
Dual JK flip-flop
14. Abbreviations
Table 11. Abbreviations
Acronym
Description
DUT
Device Under Test
ESD
ElectroStatic Discharge
HBM
Human Body Model
MM
Machine Model
15. Revision history
Table 12. Revision history
Document ID
Release date Data sheet status
Change notice Supersedes
HEF4027B_5
Modifications:
HEF4027B_4
20081110
Product data sheet
-
HEF4027B_4
• Maximum Tamb changed to 85 °C and Tamb = 125 °C parameter data removed throughout.
• Section 1 “General description” temperature range statement modified.
• Section 10 “Static characteristics” IDD, IOL, IOH and II values revised.
20080703
Product specification
-
HEF4027B_CNV_3
HEF4027B_CNV_3
19950101
Product specification
-
HEF4027B_CNV_2
HEF4027B_CNV_2
19950101
Product specification
-
-
HEF4027B_5
Product data sheet
Rev. 05 — 10 November 2008
© NXP B.V. 2008. All rights reserved.
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