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6116LA90 데이터 시트보기 (PDF) - Integrated Device Technology

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6116LA90
IDT
Integrated Device Technology IDT
6116LA90 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
IDT6116SA/LA
CMOS STATIC RAM 16K (2K x 8-BIT)
MILITARY AND COMMERCIAL TEMPERATURE RANGES
AC ELECTRICAL CHARACTERISTICS (VCC = 5V ± 10%, All Temperature Ranges)
6116SA15(1)
6116LA15(1)
6116SA20
6116LA20
6116SA25
6116LA25
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max.
WRITE CYCLE
tWC Write Cycle Time
15
20
25
tCW Chip Select to End-of-
13
15
17
Write
tAW Address Valid to End-
14
15
17
of-Write
tAS
Address Set-up Time
0
0
0
tWP Write Pulse Width
12
12
15
tWR Write Recovery Time
0
0
0
tWHZ(3) Write to Output
in High-Z
7
8
16
tDW Data to Write Time
Overlap
12
12
13
tDH(4) Data Hold from Write
0
0
0
Time
tOW(3,4) Output Active from
End-of-Write
0
0
0
6116SA35
6116LA35
Min. Max. Unit
35
ns
25
ns
25
ns
0
ns
20
ns
0
ns
20
ns
15
ns
0
ns
0
ns
3089 tbl 14
AC ELECTRICAL CHARACTERISTICS (VCC = 5V ± 10%, All Temperature Ranges)
6116SA45 6116SA55(2) 6116SA70(2) 6116SA90(2) 6116SA120(2) 6116SA150(2)
6116LA45 6116LA55(2) 6116LA70(2) 6116LA90(2) 6116LA120(2) 6116LA150(2)
Symbol
Parameter
Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Unit
WRITE CYCLE
tWC Write Cycle Time
45
— 55
— 70 —
90 — 120 — 150 — ns
tCW Chip Select to End of
Write
30
— 40
— 40 —
55 — 70 —
90 — ns
tAW Address Valid to End
of Write
30
— 45
— 65 —
80 — 105 — 120 — ns
tAS
Address Set-up Time
0
—5
— 15 —
15 — 20 —
20 — ns
tWP Write Pulse Width
25
— 40
— 40 —
55 — 70 —
90 — ns
tWR Write Recovery Time
0
—5
5—
5
5
10 — ns
tWHZ(3) Write to Output
in High-Z
25 —
30 — 35
— 40 — 40
— 40 ns
tDW Data to Write Time
Overlap
20
— 25
— 30 —
30 — 35 —
40 — ns
tDH(4)
Data Hold from Write
Time
0
—5
5—
5
5
10 — ns
tOW(3,4) Output Active from
0
—0
0—
0
0
0 — ns
End of Write
NOTES:
3089 tbl 15
1. 0°C to +70°C temperature range only.
2. –55°C to +125°C temperature range only.
3. This parameter guaranteed with AC Load (Figure 2) by device characterization, but is not production tested.
4. The specification for tDH must be met by the device supplying write data to the RAM under all operation conditions. Although tDH and tOW values will vary
over voltage and temperature, the actual tDH will always be smaller than the actual tOW.
5.1
8

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