IDT71V016SA10Y8 데이터 시트보기 (PDF) - Integrated Device Technology

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IDT71V016SA10Y8

3.3V CMOS Static RAM 1 Meg (64K x 16-Bit)

Integrated Device Technology 

IDT71V016SA, 3.3V CMOS Static RAM

1 Meg (64K x 16-Bit)

AC Test Conditions

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Reference Levels

AC Test Load

GND to 3.0V

1.5ns

1.5V

1.5V

See Figure 1, 2 and 3

3834 tbl 09

AC Test Loads

+1.5V

I/O

Z0 = 50Ω

50Ω

30pF

3834 drw 03

Figure 1. AC Test Load

Commercial and Industrial Temperature Ranges

DATA OUT

5pF*

3.3V

320Ω

350Ω

*Including jig and scope capacitance.

3834 drw 04

Figure 2. AC Test Load

(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ)

7

6

∆tAA, tACS

(Typical, ns) 5

4

3

2

1

•

•

•

•

·

•

•

8 20 40 60 80 100 120 140 160 180 200

CAPACITANCE (pF)

3834 drw 05

Figure 3. Output Capacitive Derating

6.442

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