DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

IL3843N 데이터 시트보기 (PDF) - IK Semicon Co., Ltd

부품명
상세내역
제조사
IL3843N Datasheet PDF : 5 Pages
1 2 3 4 5
IL3843
PIN FUNCTION DESCRIPTION
Pin
No.
Function
Description
1 Compensation
This pln is the Error Amplifier output and is made available for loop compensation
2 Voltage Feedback
3 Current Sense
This is the inverting input of the Error Amplifier. It is normally connected to the switching
power supply outpul through a resistor divider.
A voltage proportional to inductor current is connected to this input. The PWM uses this.
information to terminate the output switch conduction
4 RT/CT
The Oscillator frequency and maximum Output duty cycle are programmed by connecting
resistor RT to VREF and capacitor CT to ground. Operation to 500kHz is possible.
5 GND
This pin is the combined conlrol circuitry and power ground
6 Output
This output directly drives the gate of a power MOSFET. Peak currents up to 1,0A are
sourced and sunk by this pin.
7 Vcc
This pin is the positive supply of the control IC.
8 VREF
This is the reference output. It provides chsarging current for capacitor CT through resistor
RT
ABSOLUTE MAXIMUM RATINGS
Characteristic
Symbol
Value
Unit
Total Power Supply and Zener Current
Output Current
Output Energy (Capacitive Load per Cycle)
Error Amp Output Sink Current
Current Sense and Voltage Feedback Inputs
Maximum Power Dissipation @ TA= 25oC:
DIP-8
SOP-8
Thermal Resistance,Junction-to-Air
Operating Junction Temperature
Storage Temperature Range
(ICC+ IZ)
IO
W
IOE
Vin
PD
RθJA
TJ
Tstg
30
±1.0
5.0
10
-0.3 to 5.5
0.862
0.625
145
+150
-65 ~ +150
mA
A
µJ
mA
V
W
°C/W
oC
oC
* Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device.
These are stress ratings only and functional operation of the device at these or any other conditions beyond those
indicated under “recommended operating conditions” is not implied.
Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2011, February, Rev. 03

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]