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IR323/H0-A 데이터 시트보기 (PDF) - EVERLIGHT

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IR323/H0-A
Everlight
EVERLIGHT Everlight
IR323/H0-A Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
IR323/H0-A
Reliability Test Item And Condition
The reliability of products shall be satisfied with items listed below.
Confidence level90%
LTPD10%
NO. Item
Test Conditions
Test Hours/ Sample Failure
Ac/Re
Cycles Sizes Judgement
Criteria
1 Solder Heat
TEMP.260℃±5
10secs 22pcs
0/1
2 Temperature Cycle H : +10015mins 300Cycles 22pcs IRU×2
0/1
5mins
EeL×0.8
L : -4015mins
VFU×1.2
3 Thermal Shock H :+1005mins
300Cycles 22pcs
0/1
10secs
UUpper
L :-10
5mins
Specification
4 High Temperature TEMP.+100
Storage
1000hrs 22pcs Limit
0/1
LLower
5 Low Temperature TEMP.-40
1000hrs 22pcs Specification 0/1
Storage
Limit
6 DC Operating Life IF=20mA
1000hrs 22pcs
0/1
7 High Temperature/ 85/ 85% R.H
1000hrs 22pcs
0/1
High Humidity
Everlight Electronics Co., Ltd.
Device NoDIR-032-085
http:\\www.everlight.com
Prepared date07-20-2005
Rev 3
Page: 6 of 7
Prepared byJaine Tsai

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