NM25C041 데이터 시트보기 (PDF) - Fairchild Semiconductor
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NM25C041
Fairchild Semiconductor
NM25C041 Datasheet PDF : 10 Pages
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Low Voltage 2.7V ≤ VCC ≤ 4.5V Specifications
Absolute Maximum Ratings (Note 5)
Operating Conditions
Ambient Storage Temperature
All Input or Output Voltage with
Respect to Ground
Lead Temp. (Soldering, 10 sec.)
ESD Rating
-65°C to +150°C
+6.5V to -0.3V
+300°C
2000V
Ambient Operating Temperature
NM25C041L/LZ
NM25C041LE/LZE
NM25C041LV
Power Supply (VCC)
0°C to +70°C
-40°C to +85°C
-40°C to +125°C
2.7V - 4.5V
DC and AC Electrical Characteristics 2.7V ≤ VCC ≤ 4.5V
25C041L/LE
25C041LZ/LZE
Symbol
Parameter
Conditions
Min. Max.
25C041LV
Min Max Units
ICC
ICCSB
IIL
IOL
VIL
VIH
VOL
VOH
fOP
tRI
tFI
tCLH
tCLL
tCSH
tCSS
tDIS
tHDS
tCSN
tDIN
tHDN
tPD
tDH
tLZ
tDF
tHZ
tWP
Operating Current
Standby Current
L
LZ
Input Leakage
Output Leakage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
SCK Frequency
Input Rise Time
Input Fall Time
Clock High Time
Clock Low Time
Min. CS High Time
CS Setup Time
Data Setup Time
HOLD Setup Time
CS Hold Time
Data Hold Time
HOLD Hold Time
Output Delay
Output Hold Time
HOLD Output Low Z
Output Disable Time
HOLD to Output Hi Z
Write Cycle Time
CS = VIL
CS = VCC
VIN = 0 to VCC
VOUT = GND to VCC
IOL = 0.8 mA
IOH = –0.8 mA
(Note 6)
(Note 6)
(Note 7)
1-4 Bytes
3
-1
-1
-0.3
0.7 * VCC
VCC - 0.8
410
410
500
500
100
240
500
100
240
0
10
1
1
1
VCC * 0.3
VCC + 0.3
0.4
1.0
2.0
2.0
500
240
500
240
15
µA
-1
-1
-0.3
0.7 * VCC
VCC - 0.8
410
410
500
500
100
240
500
100
240
0
3
10
N/A
1
1
VCC * 0.3
VCC + 0.3
0.4
1.0
2.0
2.0
500
240
500
240
15
mA
µA
µA
V
V
V
V
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
Capacitance TA = 25°C, f = 2.1/1 MHz (Note 8)
Symbol
Test
Typ Max Units
COUT
CIN
Output Capacitance
3
8 pF
Input Capacitance
2
6 pF
AC Test Conditions
Output Load
Input Pulse Levels
Timing Measurement Reference Level
CL = 200 pF
0.1 * VCC - 0.9 * VCC
0.3 * VCC - 0.7 * VCC
Note 5: Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the
device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Note 6 : The fOP frequency specification specifies a minimum clock period of 1/fOP. Therefore, for every fOP clock cycle, tCLH + tCLL must be equal to or greater than 1/fOP. For
example, if the 2.1MHz period = 476ns and tCLH = 190ns, tCLL must be 286ns.
Note 7: CS must be brought high for a minimum of tCSH between consecutive instruction cycles.
Note 8: This parameter is periodically sampled and not 100% tested.
NM25C041 Rev. D.1
4
www.fairchildsemi.com
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