74F256 데이터 시트보기 (PDF) - Philips Electronics

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74F256

Dual addressable latch

Philips Electronics 

Philips Semiconductors

Dual addressable latch

Product specification

74F256

ABSOLUTE MAXIMUM RATINGS

(Operation beyond the limit set forth in this table may impair the useful life of the device.

Unless otherwise noted these limits are over the operating free air temperature range.)

SYMBOL

PARAMETER

VCC Supply voltage

VIN

Input voltage

IIN

Input current

VOUT Voltage applied to output in High output state

IOUT Current applied to output in Low output state

Tamb Operating free-air temperature range

Tstg

Storage temperature range

RATING

–0.5 to +7.0

–0.5 to +7.0

–30 to +5

–0.5 to VCC

40

0 to +70

–65 to +150

UNIT

V

V

mA

V

mA

°C

°C

RECOMMENDED OPERATING CONDITIONS

SYMBOL

PARAMETER

VCC

VIH

VIL

IIK

IOH

IOL

Tamb

Supply voltage

High-level input voltage

Low-level input voltage

Input clamp current

High-level output current

Low-level output current

Operating free-air temperature range

LIMITS

UNIT

MIN

NOM

MAX

4.5

5.0

5.5

V

2.0

V

0.8

V

–18

mA

–1

mA

20

mA

0

70

°C

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST

CONDITIONS1

LIMITS

UNIT

MIN TYP2 MAX

VOH

High-level output voltage

VOL

Low-level output voltage

VIK

Input clamp voltage

II

Input current at maximum input voltage

IIH

High-level input current

IIL

Low-level input current

IOS

Short-circuit output current3

VCC = MIN, VIL = MAX,

VIH = MIN, IOL = MAX

VCC = MIN, VIL = MAX,

VIH = MIN, IOL = MAX

VCC = MIN, II = IIK

VCC = MAX, VI = 7.0V

VCC = MAX, VI = 2.7V

VCC = MAX, VI = 0.5V

VCC = MAX

±10%VCC 2.5

V

±5%VCC 2.7 3.4

V

±10%VCC

0.35 0.50 V

±5%VCC

0.35 0.50 V

–0.73 -1.2 V

100 µA

20 µA

–0.6 mA

–60

–150 mA

ICC

Supply current (total)

ICCH VCC = MAX

21 42 mA

ICCL

33 60 mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. To reduce the effect of external noise during test.

4. Not more than one output should be shorted at a time. For testing IOS, the use of High-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

1988 Nov 29

5

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