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LM317L 데이터 시트보기 (PDF) - ON Semiconductor

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LM317L Datasheet PDF : 12 Pages
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LM317L, NCV317LB
ELECTRICAL CHARACTERISTICS (VI-VO = 5.0 V; IO = 40 mA; TJ = Tlow to Thigh (Note 3); Imax and Pmax (Note 4);
unless otherwise noted.)
LM317L, LB, NCV317LB
Characteristics
Figure Symbol Min
Typ
Max
Unit
Line Regulation (Note 5)
ąTA = 25°C, 3.0 V VI - VO 40 V
1
Regline
-
0.01
0.04
%/V
Load Regulation (Note 5), TA = 25°C
ą10 mA IO Imax - LM317L
ąąVO 5.0 V
ąąVO 5.0 V
2
Regload
-
-
5.0
25
mV
0.1
0.5
% VO
Adjustment Pin Current
3
IAdj
-
50
100
mA
Adjustment Pin Current Change
ą2.5 V VI - VO 40 V, PD Pmax
ąą10 mA IO Imax - LM317L
1, 2
DIAdj
-
0.2
5.0
mA
Reference Voltage
ą3.0 V VI - VO 40 V, PD Pmax
ąą10 mA IO Imax - LM317L
3
Vref
1.20
1.25
1.30
V
Line Regulation (Note 5), 3.0 V VI - VO 40 V
1
Regline
-
0.02
0.07
%/V
Load Regulation (Note 5)
ą10 mA IO Imax - LM317L
ąąVO 5.0 V
ąąVO 5.0 V
2
Regload
-
-
20
70
mV
0.3
1.5
% VO
Temperature Stability (Tlow TJ Thigh)
3
TS
-
0.7
-
% VO
Minimum Load Current to Maintain Regulation (VI - VO = 40 V)
3
ILmin
-
3.5
10
mA
Maximum Output Current
ąVI - VO 6.25 V, PD Pmax, Z Package
ąVI - VO 40 V, PD Pmax, TA = 25°C, Z Package
3
Imax
mA
100
200
-
-
20
-
RMS Noise, % of VO
ąTA = 25°C, 10 Hz f 10 kHz
-
N
-
0.003
-
% VO
Ripple Rejection (Note 6)
ąVO = 1.2 V, f = 120 Hz
ąCAdj = 10 mF, VO = 10.0 V
Thermal Shutdown (Note 7)
4
RR
dB
60
80
-
-
80
-
-
-
-
180
-
°C
Long Term Stability, TJ = Thigh (Note 8)
TA = 25°C for Endpoint Measurements
3
S
-
0.3
1.0
%/1.0 k
Hrs.
3. Tlow to Thigh = 0° to +125°C for LM317L -40° to +125°C for LM317LB, NCV317LB
4. Imax = 100 mAąąPmax = 625 mW
5. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account
separately. Pulse testing with low duty cycle is used.
6. CAdj, when used, is connected between the adjustment pin and ground.
7. Thermal characteristics are not subject to production test.
8. Since Long-Term Stability cannot be measured on each device before shipment, this specification is an engineering estimate of average
stability from lot to lot.
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