TEST CIRCUITS
LT1719
Response Time Test Circuit
+(VV+s
–
–
VCM
VCM)
0V
VCC – VCM
0.01µF
–100mV
25Ω
1
2+
8
DUT
7
10 × SCOPE PROBE
PULSE
0.1µF
25Ω
130Ω
2N3866
50k
V1* 50Ω
3
LT1719S8
–5
4
6(6)
0.01µF
(CIN ≈ 10pF)
0V
IN
1N5711
VEE – VCM
–3V
50Ω
400Ω 750Ω
–VCM
*V1 = –1000 • (OVERDRIVE + VTRIP+)
NOTE: RISING EDGE TEST SHOWN.
– 5V
FOR FALLING EDGE, REVERSE LT1719 INPUTS
1719 TC02
±VTRIP Test Circuit
BANDWIDTH-LIMITED TRIANGLE WAVE
~ 1kHz, VCM ±7.5V
VCC 0.1µF
50k
+
50Ω
50Ω
DUT
LT1719
–
200k
VCM
LTC203
14
15
3
10nF
16
9
11
10
6
LTC203
2
1
8
7
1000 × VTRIP+
1µF
10k
1/2 LT1112
–+
1000 × VHYST
1000 × VOS
10k
1/2 LT1638
+
100k
100k
–
100k
+
2.4k
–
100k
1/2 LT1638
3
1
8
0.15µF
6
NOTES: LT1638, LT1112, LTC203s ARE POWERED FROM ±15V.
200kΩ PULL-DOWN PROTECTS LTC203 LOGIC INPUTS
WHEN DUT IS NOT POWERED
2
14
15
10nF
1µF
16
9
7
11
10
1719 TC01
1/2 LT1112
–+
1000 × VTRIP–
7