LTC1151 데이터 시트보기 (PDF) - Linear Technology
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LTC1151 Datasheet PDF : 12 Pages
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LTC1151
ELECTRICAL CHARACTERISTICS The ● denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. VS = ±15V, unless otherwise specified.
PARAMETER
Maximum Output Voltage Swing
Slew Rate
Gain-Bandwidth Product
Supply Current per Amplifier
Internal Sampling Frequency
CONDITIONS
RL = 10k, TA = 25°C
RL = 10k
RL = 100k
RL = 10k, CL = 50pF
No Load, TA = 25°C
No Load
LTC1151C
MIN TYP MAX
±13.5 ±14.50
● +10.5/–13.5
±14.95
2.5
2
0.9
1.5
●
2.0
1000
UNITS
V
V
V
V/µs
MHz
mA
mA
Hz
The ● denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. VS
= 5V, unless otherwise specified.
Input Offset Voltage
Average Input Offset Drift
Long Term Offset Voltage Drift
Input Offset Current
Input Bias Current
Input Noise Voltage
Input Noise Current
Input Voltage Range
Common Mode Rejection Ratio
Power Supply Rejection Ratio
Large-Signal Voltage Gain
Maximum Output Voltage Swing
Slew Rate
Gain Bandwidth Product
Supply Current per Amplifier
TA = 25°C (Note 3)
(Note 3)
TA = 25°C
TA = 25°C
RS = 100Ω, 0.1Hz to 10Hz
RS = 100Ω, 0.1Hz to 1Hz
f = 10Hz (Note 4)
Positive
Negative
VCM = 0V to 2.7V
VS = ±2.375V to ±16V
RL = 10k, VOUT = 0.3V to 4.5V
RL = 10k to GND
RL = 100k to GND
RL = 10k, CL = 50pF
No Load, TA = 25°C
Internal Sampling Frequency
Note 1: Absolute Maximum Ratings are those values beyond which the life
of a device may be impaired.
Note 2: Connecting any terminal to voltages greater than V+ or less than V–
may cause destructive latch-up. It is recommended that no sources
operating from external supplies be applied prior to power-up of the
LTC1151.
±0.05 ±5
µV
●
±0.01 ±0.05
µV/ °C
50
nV/√mo
±10
100
pA
±5
50
pA
2.0
µVP-P
0.7
µVP-P
1.3
fA/√Hz
2.7
3.2
V
0
– 0.3
V
110
dB
●
110
130
dB
●
115
140
dB
4.85
V
4.97
V
1.5
V/µs
1.5
MHz
0.5
1.0
mA
●
1.5
mA
750
Hz
Note 3: These parameters are guaranteed by design. Thermocouple effects
preclude measurement of these voltage levels in high speed automatic test
systems. VOS is measured to a limit determined by test equipment
capability.
Note 4: Current Noise is calculated from the formula:
IN = √(2q • Ib)
where q = 1.6 × 10–19 Coulomb.
1151fa
3
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