LTC6652(RevD) 데이터 시트보기 (PDF) - Linear Technology
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LTC6652 Datasheet PDF : 20 Pages
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LTC6652
Electrical Characteristics The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C, VIN = VOUT + 0.5V, unless otherwise noted.
PARAMETER
Minimum Operating Voltage (Note 5)
Output Short-Circuit Current
Shutdown Pin (SHDN)
Supply Current
CONDITIONS
ISOURCE = 5mA, VOUT Error ≤ 0.1%
LTC6652-1.25, LTC6652-2.048
LTC6652-2.5, LTC6652-3, LTC6652-3.3,
LTC6652-4.096, LTC6652-5
Short VOUT to GND
Short VOUT to VIN
Logic High Input Voltage
Logic High Input Current
Logic Low Input Voltage
Logic Low Input Current
No Load
Shutdown Current
SHDN Tied to GND
Output Voltage Noise (Note 6)
0.1Hz ≤ f ≤ 10Hz
LTC6652-1.25
LTC6652-2.048, LTC6652-2.5, LTC6652-3
LTC6652-3.3
LTC6652-4.096
LTC6652-5
10Hz ≤ f ≤ 1kHz
Turn-On Time
0.1% Settling, CLOAD = 0
Long-Term Drift of Output Voltage (Note 7) LTC6652MS8
LTC6652LS8
Hysteresis (Note 8)
∆T = –40°C to 125°C, LTC6652MS8
∆T = –40°C to 125°C, LTC6652LS8
MIN
TYP
l
2.7
l VOUT + 0.3V
16
16
l
2
l
0.1
l
l
0.1
350
l
l
0.1
2.4
2.1
2.2
2.3
2.8
3
100
60
30
105
70
MAX
UNITS
V
V
mA
mA
V
1
µA
0.8
V
1
µA
µA
560
µA
2
µA
ppmP-P
ppmP-P
ppmP-P
ppmP-P
ppmP-P
ppmRMS
µs
ppm/√kHr
ppm/√kHr
ppm
ppm
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: If the parts are stored outside of the specified temperature range,
the output may shift due to hysteresis.
Note 3: Temperature coefficient is measured by dividing the maximum
change in output voltage by the specified temperature range.
Note 4: Load regulation is measured on a pulse basis from no load to the
specified load current. Output changes due to die temperature change
must be taken into account separately.
Note 5: Excludes load regulation errors.
Note 6: Peak-to-peak noise is measured with a 3-pole highpass at 0.1Hz
and 4-pole lowpass filter at 10Hz. The unit is enclosed in a still-air
environment to eliminate thermocouple effects on the leads. The test
time is 10 seconds. RMS noise is measured on a spectrum analyzer in
a shielded environment where the intrinsic noise of the instrument is
removed to determine the actual noise of the device.
Note 7: Long-term stability typically has a logarithmic characteristic and
therefore, changes after 1000 hours tend to be much smaller than before that
time. Total drift in the second thousand hours is normally less than one third
that of the first thousand hours with a continuing trend toward reduced drift
with time. Long-term stability will also be affected by differential stresses
between the IC and the board material created during board assembly.
Note 8: Hysteresis in output voltage is created by package stress that differs
depending on whether the IC was previously at a higher or lower temperature.
Output voltage is always measured at 25°C, but the IC is cycled to the hot
or cold temperature limit before successive measurements. Hysteresis
is roughly proportional to the square of the temperature change. For
instruments that are stored at well controlled temperatures (within 20 or 30
degrees of operational temperature) it’s usually not a dominant error source.
Note 9: The stated temperature is typical for soldering of the leads during
manual rework. For detailed IR reflow recommendations, refer to the
Applications section.
6652fd
4
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