LX8385-00ID 데이터 시트보기 (PDF) - Microsemi Corporation

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LX8385-00ID

3A Low Dropout Positive Regulators

Microsemi Corporation 



A MICROSEMI COMPANY

LX8385x-xx

3A Low Dropout Positive Regulators

PRODUCTION DATA SHEET

   


Unless otherwise specified, the following specifications apply over the operating ambient temperature for the LX8385x-xxC with

0°C ≤ TA ≤ 125°C and the LX8385-xxI with -25°C ≤ TA ≤ 125°C except where otherwise noted. Test conditions: VIN -VOUT = 3V;

IOUT = 3A. Low duty cycle pulse testing techniques are used which maintains junction and case temperatures equal to the ambient

temperature.

Parameter

Symbol

Test Conditions

LX8385-33 / 8385A-33 / 8385B- (3.3V FIXED)(CONTINUED)

Maximum Output Current

IOUT(MAX) VIN < 7V

Temperature Stability (Note 3)

OUT(T)

Long Term Stability (Note 3)

OUT (t) TA=125°C, 1000 hours

RMS Output Noise (% of VOUT)

(Note 3)

VOUT (RMS) TA=25°C, 10Hz < f < 10kHz

LX8385-05 / 8385A-05 / 8385B-05 (5.0V FIXED)

Output Voltage

(Note 4)

LX8385/85A-05

LX8385B-05

Line Regulation (Note 2)

Load Regulation (Note 2)

Thermal Regulation

Ripple Rejection (Note 3)

VIN=7V, IOUT=0mA, TA=25°C

VOUT

7V < VIN < 10V, 0mA < IOUT < 3A, P < PMAX

VIN=7V, IOUT=0mA, TA=25°C

7V < VIN < 10V, 0mA < IOUT < 3A, P < PMAX

OUT(VIN)

OUT

(IOUT)

OUT

(Pwr)

7V < VIN < 10V

VIN=7V, 0mA < IOUT < IOUT(MAX)

TA=25°C, 20ms pulse

COUT=100µF (Tantalum), IOUT=3A

Quiescent Current

IQ

0mA < IOUT < IOUT(MAX), 4.75V < VIN < 10V

Dropout Voltage LX8385-33



OUT=1%, IOUT < IOUT(MAX)

LX8385A/85B-33

OUT=1%, IOUT < IOUT(MAX)

Maximum Output Current

Temperature Stability (Note 3)

Long Term Stability (Note 3)

RMS Output Noise (% of VOUT)

(Note 3)

IOUT(MAX)

OUT (T)

OUT (t)

VIN < 10V

TA=125°C, 1000 hours

VOUT (RMS) TA=25°C, 10Hz < f < 10kHz

LX8385x-xx

Min Typ Max

Units

3

3.5

A

0.25

%

0.3

1

%

0.003

%

4.950 5.00 5.050 V

4.900 5.00 5.100 V

4.960 5.00 5.040 V

4.950 5.00 5.050 V

2

10

mV

5

25

mV

0.01 0.02 % / W

60

83

dB

4

10

mA

1.2

1.5

V

1.1

1.3

V

3

3.5

A

0.25

%

0.3

1

%

0.003

%

Note 2

Note 3

Note 4

Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output

voltage due to heating effects are covered under the specification for thermal regulation.

These parameters, although guaranteed are not tested in production.

See Maximum Output Current Section

Copyright © 2000

Rev. 2.0a, 2001-03-15

Microsemi

Linfinity Microelectronics Division

11861 Western Avenue, Garden Grove, CA. 92841, 714-898-8121, Fax: 714-893-2570

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