M27C512
Table 7. Read Mode DC Characteristics
Symbol
Parameter
Test Condition (1)
Min
ILI
Input Leakage Current
ILO Output Leakage Current
0V ≤ VIN ≤ VCC
0V ≤ VOUT ≤ VCC
ICC Supply Current
E = VIL, G = VIL,
IOUT = 0mA, f = 5MHz
ICC1 Supply Current (Standby) TTL
E = VIH
ICC2 Supply Current (Standby) CMOS
E > VCC – 0.2V
IPP Program Current
VPP = VCC
VIL Input Low Voltage
–0.3
VIH (2) Input High Voltage
2
VOL Output Low Voltage
IOL = 2.1mA
Output High Voltage TTL
VOH
Output High Voltage CMOS
IOH = –1mA
IOH = –100µA
3.6
VCC – 0.7V
Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP.
2. Maximum DC voltage on Output is VCC +0.5V.
Max
±10
±10
30
1
100
10
0.8
VCC + 1
0.4
Unit
µA
µA
mA
mA
µA
µA
V
V
V
V
V
Table 8. Read Mode AC Characteristics
M27C512
Symbol Alt
Parameter
Test Condition (1) -45 (3)
-60
-70
-80
Unit
Min Max Min Max Min Max Min Max
tAVQV
tACC
Address Valid to
Output Valid
E = VIL, G = VIL
45
60
70
80 ns
tELQV
tCE
Chip Enable Low to
Output Valid
G = VIL
45
60
70
80 ns
tGLQV
tOE
Output Enable Low
to Output Valid
E = VIL
25
30
35
40 ns
tEHQZ (2)
tDF
Chip Enable High
to Output Hi-Z
G = VIL
0 25 0 25 0 30 0 30 ns
tGHQZ (2)
tDF
Output Enable
High to Output Hi-Z
E = VIL
0 25 0 25 0 30 0 30 ns
tAXQX
tOH
Address Transition
to Output Transition
E = VIL, G = VIL
0
0
0
0
ns
Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP.
2. Sampled only, not 100% tested.
3. Speed obtained with High Speed AC measurement conditions.
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