MAXQ1004-B01 데이터 시트보기 (PDF) - Maxim Integrated
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MAXQ1004-B01 Datasheet PDF : 18 Pages
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1-Wire and SPI Authentication Microcontroller
RECOMMENDED DC OPERATING CONDITIONS (continued)
(VDD = 1.7V to 3.6V, TA = -40NC to +85NC, unless otherwise noted. Typical values are at TA = +25NC and VDD = 3.3V, unless oth-
erwise noted.) (Note 1)
PARAMETER
INTERNAL OSCILLATOR
Oscillator Frequency
Oscillator Startup Time
Oscillator Duty Cycle
NANOPOWER RING OSCILLATOR
Nanopower Ring Frequency
SYMBOL
fOSC
tOSC_RDY
fNANO
Nanopower Ring Current
INANO
CONDITIONS
VREG18 = 1.8V (Note 6)
(Note 6)
TA = +25NC
Typical at VDD = 3.0V, active
during wake-up (Note 6)
MIN
TYP
MAX UNITS
5
6
7
MHz
350
Fs
45
55
%
3
11
22
kHz
120
400
nA
Wakeup Timer Interval
FLASH MEMORY
Flash Erase Time
Flash Programming Time per Word
Write/Erase Cycles
Data Retention
Analog Supply Voltage
tWAKEUP
tPROG
VAVDD
1/fNANO
Mass erase
Page erase
TA = +25NC
tNANO
65,535
x tNANO
s
20
20
20
1000
100
VDD
40
ms
40
40
Fs
Cycles
Years
V
10-BIT ADC PERFORMANCE
(VDD = 1.7V to 3.6V, VREF = 1.845V, TA = -40NC to +85NC, unless otherwise noted.)
PARAMETER
Resolution
ADC Clock Frequency
ADC Clock Period
AN0 Input Voltage Range
Analog Input Capacitance
Integral Nonlinearity
Differential Nonlinearity
Offset Error
ADC Active Current Consumption
ADC Setup Time
ADC Output Latency
SYMBOL
CONDITIONS
fACLK
tACLK
VAN0
CAIN
INL
DNL
VOS
IADC
tADC_SETUP
tADC
(Note 6)
No missing codes over temperature
ACLK = 6MHz, internal reference
on, ADEN = 1 (Note 6)
ADC Settling Time
Settling time due to channel, refer-
tADC_SETTLE ence or scale change (not produc-
tion tested)
ADC Throughput
TEMPERATURE SENSOR
Temperature Sensor Setup Time
Temperature Sensor Error
fADC
tTSN_SETUP
DTSN
MIN
VGND
TYP
10
fSYSCLK
1/fACLK
1
MAX
VAVDD
Q2
Q1
Q2
100
150
25
1025
10
fADC/tADC
25
Q6
UNITS
Bits
MHz
Fs
V
pF
LSB
LSB
LSB
FA
Fs
tACLK
Fs
ksps
Fs
NC
5
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