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MC100E158 데이터 시트보기 (PDF) - ON Semiconductor

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MC100E158
ON-Semiconductor
ON Semiconductor ON-Semiconductor
MC100E158 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
MC10E158, MC100E158
Table 7. 100E SERIES NECL DC CHARACTERISTICS VCCx = 0 V; VEE = −5.0 V (Note 7)
0°C
25°C
85°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min Typ Max Unit
IEE
Power Supply Current
33
40
33
40
38
46 mA
VOH
Output HIGH Voltage (Note 8)
−1025 −950 −880 −1025 −950 −880 −1025 −950 −880 mV
VOL
Output LOW Voltage (Note 8)
−1810 −1705 −1620 −1810 −1745 −1620 −1810 −1740 −1620 mV
VIH
Input HIGH Voltage
−1165 −1025 −880 −1165 −1025 −880 −1165 −1025 −880 mV
VIL
Input LOW Voltage
−1810 −1645 −1475 −1810 −1645 −1475 −1810 −1645 −1475 mV
IIH
Input HIGH Current
D
200
200
200 mA
SEL
150
150
150 mA
IIL
Input LOW Current
0.5 0.3
0.5 0.25
0.5 0.2
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
7. Input and output parameters vary 1:1 with VCC. VEE can vary −0.46 V / +0.8 V.
8. Outputs are terminated through a 50 W resistor to VCC − 2.0 V.
Table 8. AC CHARACTERISTICS VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 9)
0°C
25°C
85°C
Symbol
fMAX
tPLH
tPHL
Characteristic
Maximum Toggle Frequency
Propagation Delay to Output
Min Typ Max Min Typ Max Min Typ Max Unit
700 1100
700 1100
700 1100
MHz
ps
D 250 500 650 250 500 650 250 500 650
SEL 450 700 825 450 700 825 450 700 825
tSKEW
tJITTER
tr
tf
Within-Device Skew (Note 10)
Random Clock Jitter (RMS)
Rise/Fall Time
(20 - 80%)
60
60
60
ps
<1
<1
<1
ps
ps
275 425 650 275 425 650 275 425 650
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
9. 10 Series: VEE can vary −0.46 V / +0.06 V.
100 Series: VEE can vary −0.46 V / +0.8 V.
10. Within-device skew is defined as identical transitions on similar paths through a device.
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