MC100LVEP111MNG 데이터 시트보기 (PDF) - ON Semiconductor
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MC100LVEP111MNG Datasheet PDF : 10 Pages
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MC100LVEP111
Table 9. AC CHARACTERISTICS VCC = 0 V; VEE = −2.375 to −3.8 V or VCC = 2.375 to 3.8 V; VEE = 0 V (Note 14)
−40°C
25°C
85°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min Typ Max Unit
fmaxPECL/HSTL
tPLH
tPHL
tskew
Maximum Frequency (Figure 4)
Propagation Delay
(Differential Configuration)
Within−Device Skew (Note 15)
Within−Device Skew @ 2.5 V (Note
15)
Device−to−Device Skew (Note 16)
3
3
3
GHz
325 400 475 350 430 500 440 510 590 ps
20 25
20 25
85 150
20 25
20 25
85 150
25 35 ps
20 25
85 150
tJITTER
CLOCK Random Jitter (RMS)
@ v0.5 GHz
@ v1.0 GHz
@ v1.5 GHz
@ v2.0 GHz
@ v2.5 GHz
@ v3.0 GHz
0.209 0.5
0.200 0.5
0.197 0.4
0.220 0.5
0.232 0.4
0.348 0.6
0.204 0.5
0.214 0.6
0.213 0.5
0.224 0.5
0.290 0.5
0.545 0.8
ps
0.221 0.5
0.229 0.5
0.243 0.4
0.292 0.6
0.522 0.8
0.911 1.3
VPP
Minimum Input Swing
150 800 1200 150 800 1200 150 800 1200 mV
tr/tf
Output Rise/Fall Time (20%−80%)
105 200 255 125 200 275 150 230 320 ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
14. Measured with 750 mV source, 50% duty cycle clock source. All loading with 50 W to VCC − 2.0 V.
15. Skew is measured between outputs under identical transitions and conditions on any one device.
16. Device−to−Device skew for identical transitions at identical VCC levels.
800
700
600
500
400
300
200
100
0
0
1000
2000
3000
4000
FREQUENCY (MHz)
Figure 4. Fmax Typical
5000
6000
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