MC100LVEP34 데이터 시트보기 (PDF) - ON Semiconductor

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MC100LVEP34

2.5V / 3.3VECL ÷2, ÷4, ÷8 Clock Generation Chip

ON Semiconductor 

MC100LVEP34

Table 3. ATTRIBUTES

Characteristics

Value

Internal Input Pulldown Resistor

75 kW

Internal Input Pullup Resistor

37.5 kW

ESD Protection

Human Body Model

Machine Model

Charged Device Model

> 2 kV

> 200 V

> 2 kV

Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)

Level 1

Flammability Rating

Oxygen Index: 28 to 34

UL 94 V−O @ 0.125 in

Transistor Count

210 Devices

Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test

1. For additional Moisture Sensitivity information, refer to Application Note AND8003/D.

Table 4. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

VCC

PECL Mode Power Supply

VEE

NECL Mode Power Supply

VI

PECL Mode Input Voltage

NECL Mode Input Voltage

VEE = 0 V

VCC = 0 V

VEE = 0 V

VCC = 0 V

VI  VCC

VI  VEE

6

V

−6

V

6

V

−6

V

Iout

Output Current

Continuous

Surge

50

mA

100

mA

IBB

VBB Sink/Source

TA

Operating Temperature Range

Tstg

Storage Temperature Range

qJA

Thermal Resistance (Junction−to−Ambient) 0 lfpm

500 lfpm

SOIC−16

SOIC−16

± 0.5

−40 to +85

−65 to +150

100

60

mA

°C

°C

°C/W

°C/W

qJC

Thermal Resistance (Junction−to−Case) Standard Board

SOIC−16

qJA

Thermal Resistance (Junction−to−Ambient) 0 lfpm

500 lfpm

TSSOP−16

TSSOP−16

33 to 36

138

108

°C/W

°C/W

°C/W

qJC

Thermal Resistance (Junction−to−Case) Standard Board

TSSOP−16

33 to 36

°C/W

Tsol

Wave Solder

<2 to 3 sec @ 248°C

265

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

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