MC10E1652(2013) 데이터 시트보기 (PDF) - ON Semiconductor

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MC10E1652
(Rev.:2013)

5V, -5V Dual ECL Output Comparator with Latch

ON Semiconductor 

MC10E1652

DELAY DISPERSION

Under a constant set of input conditions comparators have

a specified nominal propagation delay. However, since

propagation delay is a function of input slew rate and input

voltage overdrive the delay dispersion parameters, TDE and

TDT, are provided to allow the user to adjust for these

variables (where TDE and TDT apply to inputs with standard

ECL and TTL levels, respectively).

Figure 6. and Figure 7. define a range of input conditions

which incorporate varying input slew rates and input voltage

overdrive. For input parameters that adhere to these

constraints the propagation delay can be described as:

TNOM ± TDE (or TDT)

where TNOM is the nominal propagation delay. TNOM

accounts for nonuniformity introduced by temperature and

voltage variability, whereas the delay dispersion parameter

takes into consideration input slew rate and input voltage

overdrive variability. Thus a modified propagation delay can

be approximated to account for the effects of input conditions

that differ from those under which the parts where tested. For

example, an application may specify an ECL input with a

slew rate of 0.25 V/NS, an overdrive of 17 mV and a

temperature of 25°C, the delay dispersion parameter would

be 100 ps. The modified propagation delay would be

775 ps ± 100 ps

-0.9 V

- 1.07 V

INPUT

THRESHOLD

RANGE

- 1.58 V

- 1.75 V

SLEW RATE =

0.25 V/NS

SLEW RATE = 0.75 V/NS

2.5 V

2.0 V

INPUT

THRESHOLD

RANGE

0.5 V

0V

SLEW RATE =

0.30 V/NS

SLEW RATE = 0.75 V/NS

Figure 6. ECL Dispersion Test Input Conditions

Figure 7. TTL Dispersion Test Input Conditions

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