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MC1471 데이터 시트보기 (PDF) - ON Semiconductor

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MC1471 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
MC1741C
1000
100
BW = 1.0 Hz to 1.0 kHz
BW = 1.0 Hz to 1.0 kHz
100
10
10
1.0
0
10
100
1.0 k
10 k
100 k
RS, SOURCE RESISTANCE ()
1.0 M
Figure 1. Burst Noise versus Source Resistance
0.1
10
100
1.0
10 k
100 k
RS, SOURCE RESISTANCE ()
1.0 M
Figure 2. RMS Noise versus Source Resistance
10
AV = 1000
1.0
100
10
0.1
1.0
0.01 10
100
1.0 k
10 k
100 k
RS, SOURCE RESISTANCE ()
1.0 M
Figure 3. Output Noise versus Source Resistance
14.0
12.0
10.0
8.0
6.0
4.0
2.0
0
10
AV = 10, RS = 100 k
100
1.0 k
10 k
f, FREQUENCY (Hz)
100 k
Figure 4. Spectral Noise Density
100 k
Positive
Threshold
+
Voltage
-
-
100 k
x500
x2
+
1.0 k
100 k
Operational Amplifier
Under Test
Low Pass
Filter
1.0 Hz to 1.0 kHz
+
-
Negative
Threshold
Voltage
To Pass / Fail
Indicator
Unlike conventional peak reading or RMS meters, this system was
especially designed to provide the quick response time essential
to burst (popcorn) noise testing.
The test time employed is 10 sec and the 20 mV peak limit
refers to the operational amplifier input thus eliminating errors
in the closed loop gain factor of the operational amplifier.
Figure 5. Burst Noise Test Circuit
http://onsemi.com
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