MC34726 데이터 시트보기 (PDF) - Freescale Semiconductor

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MC34726

300 mA High Efficiency Low Quiescent Current Synchronous Buck Regulator With Z-mode

Freescale Semiconductor 

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

Table 3. Maximum Ratings

All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or

permanent damage to the device.

Ratings

Symbol

Value

Unit

ELECTRICAL RATINGS

All pins voltages

ESD Voltage(1)

Human Body Model (HBM)

Machine Model (MM)

VIN, VEN, VFB,

-0.3 to 6.0

V

VSW

VESD

V

±2000

±200

THERMAL RATINGS

Operating Ambient Temperature Range

Storage Temperature Range

Maximum Lead Temperature(2),(3)

Junction Temperature

Operating Junction Temperature

Maximum Junction Temperature

Thermal Resistance(4)

Junction-to-Case

Junction-to-Ambient

Power Dissipation

Continuous (Derate 3.0 mW/°C and over TA = 70°C)

TA

TSTG

TPPRT

TJ

RθJC

RθJA

PD

-25 to +85

-25 to +150

Note 3

125

+150

104

122

0.5

°C

°C

°C

°C

°C/W

W

Notes

1. ESD testing is performed in accordance with the Human Body Model (HBM) (CZAP = 100 pF, RZAP = 1500 Ω), and the Machine Model

(MM) (CZAP = 200 pF, RZAP = 0 Ω).

2. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may

cause malfunction or permanent damage to the device.

3. Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow

Temperature and Moisture Sensitivity Levels (MSL). Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes

and enter the core ID to view all orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics.

4. Device mounted on the Freescale EVB test board per JEDEC DESD51-2.

Analog Integrated Circuit Device Data

Freescale Semiconductor

34726

5

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