FMBT3904 데이터 시트보기 (PDF) - Formosa Technology

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FMBT3904

SMD NPN Transistor

Formosa Technology 

SMD NPN Transistor

FMBT3904

High reliability test capabilities

Item Test

Conditions

1. Steady State Operating Life

PD=225mW Test Duration:1000hrs

Formosa MS

2. High Temperature Reverse Bias

3. Temperature Cycle

4. Autoclave

Tj= 150℃, V = CE 80% related volage, 1000hrs

-55℃(15min) to 150℃( 15min) Air to Air Transition Time< 20sec Test Cycles: 1000cycle

P=2atm Ta= 121℃ RH= 100% Test Duration: 96hrs

5. High Temperature Storage Life

Ta=150℃ Test Duration: 1000hrs

6. Solderability

245℃,5sec

7. High Temperature High Humidity Reverse

Bias

Ta= 85℃, 85% RH, V = CE 80% related volage, 1000hrs

8. Resistance to Soldering Heat

260℃,10sec

http://www.formosams.com/

TEL:886-2-22696661

FAX:886-2-22696141

Page 11

Document ID Issued Date

DS-231106

2008/02/10

Revised Date Revision

2012/01/11

F

Page.

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