NB100LVEP221FAG 데이터 시트보기 (PDF) - ON Semiconductor

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NB100LVEP221FAG

2.5V/3.3V1:20 Differential HSTL/ECL/PECL Clock Driver

ON Semiconductor 

NB100LVEP221

Table 3. ATTRIBUTES

Characteristics

Value

Internal Input Pulldown Resistor

75 kW

Internal Input Pullup Resistor

37.5 kW

ESD Protection

Human Body Model

Machine Model

Charged Device Model

> 2 kV

> 200 V

> 2 kV

Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)

Pb Pkg

Pb−Free Pkg

LQFP−52

Level 2

Level 3

Flammability Rating

Oxygen Index: 28 to 34

UL 94 V−0 @ 0.125 in

Transistor Count

533 Devices

Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test

1. For additional information, refer to Application Note AND8003/D.

Table 4. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

VCC

PECL Mode Power Supply

VEE

NECL Mode Power Supply

VI

PECL Mode Input Voltage

NECL Mode Input Voltage

Iout

Output Current

VEE = 0 V

VCC = 0 V

VEE = 0 V

VCC = 0 V

Continuous

Surge

VI ≤ VCC

VI ≥ VEE

6

V

−6

V

6

V

−6

V

50

mA

100

mA

IBB

VBB Sink/Source

TA

Operating Temperature Range

Tstg

Storage Temperature Range

qJA

Thermal Resistance (Junction−to−Ambient)

0 lfpm

(See Application Information)

500 lfpm

52 LQFP

52 LQFP

± 0.5

−40 to +85

−65 to +150

35.6

30

mA

°C

°C

°C/W

°C/W

qJC

Thermal Resistance (Junction−to−Case)

(See Application Information)

0 lfpm

500 lfpm

Tsol

Wave Solder

Pb

Pb−Free

52 LQFP

52 LQFP

3.2

°C/W

6.4

°C/W

265

°C

265

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

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