SPT7810 데이터 시트보기 (PDF) - Signal Processing Technologies

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SPT7810

10-BIT, 20 MSPS, ECL OUTPUT A/D CONVERTER

Signal Processing Technologies 

TEST LEVEL CODES

TEST LEVEL

All electrical characteristics are subject to the

I

following conditions:

II

All parameters having min/max specifications

are guaranteed. The Test Level column indi-

III

cates the specific device testing actually per-

IV

formed during production and Quality Assur-

ance inspection. Any blank section in the data

V

column indicates that the specification is not

tested at the specified condition.

VI

TEST PROCEDURE

100% production tested at the specified temperature.

100% production tested at TA=25 °C, and sample

tested at the specified temperatures.

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design

and characterization data.

Parameter is a typical value for information purposes

only.

100% production tested at TA = 25 °C. Parameter is

guaranteed over specified temperature range.

Figure 1A: Timing Diagram

N

tpwH

CLK

CLK

Output

Data

Figure 1B: Single Event Clock

CLK

CLK

Output

Data

N+1

tpwL

N+2

td

Data Valid

N

Data Valid

N+1

td

Data Valid

Table I - Timing Parameters

PARAMETERS

DESCRIPTION

MIN

TYP

MAX

UNITS

td

CLK to Data Valid Prop Delay

-

5

ns

tpwH

CLK High Pulse Width

20

-

300

ns

tpwL

CLK Low Pulse Width

20

-

-

ns

SPT

4

SPT7810

3/11/97

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