NX3L4684 데이터 시트보기 (PDF) - NXP Semiconductors.

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NX3L4684

Dual low-ohmic single-pole double-throw analog switch

NXP Semiconductors. 

NXP Semiconductors

NX3L4684

Dual low-ohmic single-pole double-throw analog switch

11.1 Test circuits

VIL or VIH

VCC

nS

nY0 1

switch

nZ

nY1 2

IS

VI

GND

VI = 0.3 V or VCC − 0.3 V; VO = VCC − 0.3 V or 0.3 V.

Fig 5. Test circuit for measuring OFF-state leakage current

switch nS

1

VIH

2

VIL

VO

012aaa000

VIL or VIH

IS

VCC

nS

nY0 1

switch

nZ

nY1 2

switch nS

1

VIH

2

VIL

VI

GND

VI = 0.3 V or VCC − 0.3 V; VO = VCC − 0.3 V or 0.3 V.

Fig 6. Test circuit for measuring ON-state leakage current

VO

012aaa001

NX3L4684_4

Product data sheet

Rev. 04 — 24 March 2010

© NXP B.V. 2010. All rights reserved.

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