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CAT28F010N-70T 데이터 시트보기 (PDF) - Catalyst Semiconductor => Onsemi

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CAT28F010N-70T
Catalyst
Catalyst Semiconductor => Onsemi Catalyst
CAT28F010N-70T Datasheet PDF : 14 Pages
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CAT28F010
SUPPLY CHARACTERISTICS
Symbol
VCC
VPPL
VPPH
Parameter
VCC Supply Voltage
VPP During Read Operations
VPP During Read/Erase/Program
A.C. CHARACTERISTICS, Read Operation
VCC = +5V ±10%, unless otherwise specified.
Limits
Min
Max.
Unit
4.5
5.5
V
0
6.5
V
11.4
12.6
V
JEDEC Standard
Symbol Symbol Parameter
tAVAV
tELQV
tAVQV
tGLQV
tAXQX
tRC
tCE
tACC
tOE
tOH
Read Cycle Time
CE Access Time
Address Access Time
OE Access Time
Output Hold from Address
OE/CE Change
tGLQX tOLZ(1)(6)
tELZX
tLZ(1)(6)
tGHQZ tDF(1)(2)
tEHQZ tDF(1)(2)
tWHGL(1)
-
OE to Output in Low-Z
CE to Output in Low-Z
OE High to Output High-Z
CE High to Output High-Z
Write Recovery Time
Before Read
28F010-70(8)
Min. Max.
70
70
70
28
0
0
0
20
30
6
28F010-90(7) 28F010-12(7)
Min. Max. Min. Max.
90
120
90
120
90
120
35
50
0
0
0
0
0
0
20
30
30
40
6
6
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
Figure 1. A.C. Testing Input/Output Waveform(3)(4)(5)
2.4 V
0.45 V
INPUT PULSE LEVELS
2.0 V
0.8 V
REFERENCE POINTS
Testing Load Circuit (example)
5108 FHD F03
Figure 2. Highspeed A.C. Testing Input/Output
Waveform(3)(4)(5)
3.0 V
0.0 V
INPUT PULSE LEVELS
1.5 V
REFERENCE POINTS
Testing Load Circuit (example)
5108 FHD F03A
1.3V
1N914
1.3V
1N914
3.3K
3.3K
DEVICE
UNDER
TEST
Note:
OUT
CL = 100 pF
CL INCLUDES JIG CAPACITANCE
5108 FHD F04
DEVICE
UNDER
TEST
CL = 30 pF
OUT
CL INCLUDES JIG CAPACITANCE
5108 FHD F05
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) Output floating (High-Z) is defined as the state where the external data line is no longer driven by the output buffer.
(3) Input Rise and Fall Times (10% to 90%) < 10 ns.
(4) Input Pulse Levels = 0.45V and 2.4V. For High Speed Input Pulse Levels 0.0V and 3.0V.
(5) Input and Output Timing Reference = 0.8V and 2.0V. For High Speed Input and Output Timing Reference = 1.5V.
(6) Low-Z is defined as the state where the external data may be driven by the output buffer but may not be valid.
(7) For load and reference points, see Fig. 1
(8) For load and reference points, see Fig. 2
5
Doc. No. 25005-0A 2/98 F-1

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