CXD1179Q 데이터 시트보기 (PDF) - Sony Semiconductor

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CXD1179Q

8-bit 35MSPS Video A/D Converter with Clamp Function

Sony Semiconductor 

CXD1179Q

Electrical Characteristics Measurement Circuit

} Integral non-linearity error

Differential non-linearity error

measurement circuit

Offset voltage

+V

Tri-state output measurement circuit

S2

S1: ON IF A < B

S2: ON IF B > A

S1

Measurement

point

DVDD

RL

–V

VIN

DVM

DUT 8

CXD1179Q

A<B A>B

COMPARATOR

A8

B8 8

to

to

A1

A0

“0”

B1

B0

“1”

CLK (35MHz)

CONTROLLER

BUFFER

000 · · · 00

8

to

111 · · · 10

To output pin

CL

RL

Note) CL includes capacitance of the probe and others.

} Maximum operational speed

Differential gain error

measurement circuit

Differential phase error

2.5V

S.G.

NTSC

SIGNAL

SOURCE

Fc – 1kHz

1

AMP

2

100

40 IRE

MODULATION

BURST

0

–40

SYNC

0.5V

VIN CXD

1179Q

2.5V

0.5V

S.G.

(CW) FC

8

TTL

ECL

TTL

ECL

CX20202A-1

1

8

10bit

D/A

620

2

–5.2V CLK

620

–5.2V

H.P.F

ERROR RATE

COUNTER

VECTOR

SCOPE

D.G

D.P.

Digital output current measurement circuit

2.5V

0.5V

VDD

VRT

VIN

VRB

CLK

OE

GND

IOL

VOL +

–

2.5V

0.5V

—9—

VDD

VRT

VIN

VRB

CLK

OE

GND

IOH

VOH +

–

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