CXD1177Q 데이터 시트보기 (PDF) - Sony Semiconductor

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CXD1177Q

8-bit 40MSPS YC 2-channel D/A Converter

Sony Semiconductor 

CXD1177Q

Electrical Characteristics

(FCLK=40 MHz, AVDD=DVDD=5 V, ROUT=200 Ω, VREF=2.0 V, Ta=25 °C)

Item

Symbol Measurement conditions

Resolution

n

Conversion speed

FCLK

AVDD=DVDD=4.75 to 5.25 V

Ta=–40 to +85 °C

Integral non-linearity error EL

Differential non-linearity error ED

Endpoint

Output full-scale voltage

VFS

Output full-scale ratio ∗1

FSR

Output full-scale current

IFS

Output offset voltage

VOS When “00000000” data input

Glitch energy

GE

ROUT=75 Ω

Crosstalk

CT

When 1 kHz sine wave input

Supply current

IDD

When 14.3 MHz

CE=L

ISTB color bar data input CE=H

Analog input resistance

RIN

VREF

Input capacitance

CI

Digital input voltage

VIH

AVDD=DVDD=4.75 to 5.25 V

VIL

Ta=–20 to +75 °C

Digital input current

IIH

AVDD=DVDD=4.75 to 5.25 V

IIL

Ta=–20 to +75 °C

Setup time

ts

ROUT=75 Ω

Hold time

th

ROUT=75 Ω

Propagation delay time

CE enable time ∗2

CE disable time ∗2

tPD

tE

CE=H→L

tD

CE=L→H

Min. Typ. Max. Unit

8

bit

0.5

40 MSPS

–2.5

–0.3

1.8

2.0

0

1.5

10

30

57

1

2.4

2.5 LSB

0.3 LSB

2.2

V

3.0

%

15

mA

1

mV

pV•s

dB

32

mA

1.2

MΩ

9

pF

V

0.8

–5

5

µA

5

ns

10

ns

10

ns

2

4

ms

2

4

ms

∗1 Full-scale output ratio =

Full-scale voltage for each channel

–1 × 100 (%)

Full-scale voltage average value for each channels

∗2 When the external capacitors for the VG pins are 0.1 µF.

Electrical Characteristics Measurement Circuit

} Analog Input Resistance

Digital Input Current

Measurement Circuit

A

V

+5.25V

AVDD, DVDD

CXD1177Q

AVSS, DVSS

—5—

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