PBHV8540Z 데이터 시트보기 (PDF) - NXP Semiconductors.
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PBHV8540Z Datasheet PDF : 13 Pages
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NXP Semiconductors
8. Test information
PBHV8540Z
500 V, 0.5 A NPN high-voltage low VCEsat (BISS) transistor
VBB
VCC
(probe)
oscilloscope
450 Ω
VI
RB
R2
R1
Fig 12. Test circuit for switching times
RC
Vo (probe)
oscilloscope
450 Ω
DUT
mlb826
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
9. Package outline
7.3 3.7
6.7 3.3
6.7
6.3
3.1
2.9
4
1.8
1.5
1.1
0.7
1
2
2.3
4.6
Dimensions in mm
Fig 13. Package outline SOT223 (SC-73)
3
0.8
0.6
0.32
0.22
04-11-10
10. Packing information
PBHV8540Z_2
Product data sheet
Table 8. Packing methods
The indicated -xxx are the last three digits of the 12NC ordering code.[1]
Type number Package Description
PBHV8540Z SOT223 8 mm pitch, 12 mm tape and reel
Packing quantity
1 000
4 000
-115
-135
[1] For further information and the availability of packing methods, see Section 14.
Rev. 02 — 14 January 2009
© NXP B.V. 2009. All rights reserved.
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