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HI2302 데이터 시트보기 (PDF) - Intersil

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HI2302 Datasheet PDF : 16 Pages
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HI2302
Electrical Specifications Measurement Circuits (Continued)
2.5V
0.5V
VDD
VRT
VIN
VRB
CLK
OE
GND
IOL
+
VOL -
2.5V
0.5V
VDD
VRT
VIN
VRB
CLK
OE
GND
IOH
+
VOH -
FIGURE 6. DIGITAL OUTPUT CURRENT TEST CIRCUIT
Operation (See Block diagram and Timing Chart II)
• The HI2302 is a two-step parallel system A/D converter
featuring a 4-bit upper comparator block and two lower
comparator blocks of 4-bit each. The reference voltage
that is equal to the voltage between VRT - VRB/16 is
constantly applied to the upper 4-bit comparator block.
Voltage that corresponded to the upper data is fed
through the reference supply to the lower 4-bit
comparator block. Voltage that corresponded to the
upper data is fed through the reference supply to the
lower 4-bit comparator block. VRTS and VRBS pins
serve for the self generation of VRT (reference voltage
top) and VRB (reference voltage bottom), and they are
also used as the sense pins as shown in the
Application Circuit examples Figures 10 and 11.
• This IC uses an offset cancel type comparator which
operates synchronously with an external clock. It
features the following operating modes which are
respectively indicated on the Timing Chart II with S, H,
C symbols. That is input sampling (auto zero) mode,
input hold mode and comparison mode.
• The operation of respective parts is as indicated in the
Timing Chart II. For instance, input voltage VI (1) is
sampled with the falling edge of the external clock (1)
by means of the upper comparator block and the lower
comparator A block.
The upper comparator block finalizes comparison data
MD (1) with the rising edge of the external clock (2).
Simultaneously the reference supply generates the
lower reference voltage RV (1) that corresponded to
the upper results. The lower comparator A Block
finalizes comparison data LD (1) with the rising edge of
the external clock (3). MD (1) and LD (1) are combined
and output as Out (1) with the rising edge of the
external clock (4). Accordingly there is a 2.5 clock
delay from the analog input sampling point to the digital
data output.
Notes On Operation
• VDD , VSS
To reduce noise effects, separate the analog and digital
systems close to the device. For both the digital and
analog VDD pins, use a ceramic capacitor of about 0.1µF
set as close as possible to the pin to bypass to the
respective GNDs.
• Analog Input
Compared with the flash type A/D converter, the input
capacitance of the analog input is rather small.
However, it is necessary to conduct the drive with an
amplifier featuring sufficient band and drive capability.
When driving with an amplifier of low output
impedance, parasitic oscillation may occur. That may
be prevented by insetting a resistance of about 33in
series between the amplifier output and A/D input.
When the VIN signal of pin No. 21 is monitored, the
kickback noise of clock is. However, this has no effect
on the characteristics of A/D conversion.
• Clock Input
The clock line wiring should be as short as possible
also, to avoid any interference with other signals,
separate it from other circuits.
• Reference Input
Voltage VRT to VRB is compatible with the dynamic
range of the analog input. Bypassing VRT and VRB
pins to GND, by means of a capacitor about 0.1µF,
stable characteristics are obtained. By shorting VDD
and VRTS, VSS and VRBS respectively, the self-bias
function that generates VRT = about 2.5V and VRB =
about 0.6V, is activated.
• Timing
Analog input is sampled with the falling edge of CLK
and output as digital data synchronized with a delay of
2.5 clocks and with the following rising edge. The delay
from the clock rising edge to the data output is about
9ns (DVDD = 5V).
• OE Pin
Pins 1 to 8 (D0 to D7) are in the output mode by leaving
OE open or connecting it to DVSS, and they are in the
high impedance mode by connecting it to DVDD.
10

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