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RE46C143

CMOS Photoelectric Smoke Detector ASIC with Interconnect

Microchip Technology 

RE46C143

CMOS Photoelectric Smoke Detector ASIC with Interconnect

Product Specification

R&E International

A Subsidiary of Microchip Technology Inc.

AC Electrical Characteristics at TA =-25° to 75°, VDD=9V, VSS=0V, Component Values from Figure 2 ;

R9=100KΩ, R12=10MΩ, C5= 1.5nF(unless otherwise noted)

Parameter

Oscillator Period

LED and STROBE On Time

LED Period

STROBE and IRED Pulse

Period

IRED On Time

Horn On Time

Horn Off Time

IO Charge Dump Duration

IO Delay

IO Filter

Remote Alarm Delay

Symbol

TPOSC

TON1

TPLED1

TPLED2

TPLED4

TPER1

TPER1A

TPER1B

TPER2

TPER3

TPER4

TPER5

TON2

THON1

THON2

THOF1

THOF3

TIODMP

TIODLY1

TIOFILT

TIODLY2

Test

Pin

12

11,4

11

11

11

4,6

4,6

4,6

4,6

4,6

4,6

4,6

6

8,9

8,9

8,9

8,9

7

7

7

7

Test Conditions

No Alarm Condition, Note 2

Operating

Standby, No Alarm

Local Alarm Condition

Remote Alarm Only

Standby, No Alarm

Standby, After 1 Valid Smoke

Sample

Standby, After 2 Consecutive Valid

Smoke Samples

In Local Alarm – (3 Consecutive

Valid Smoke Samples)

In Remote Alarm

Pushbutton Test

Chamber Test or Low Battery

Test, no Alarms

Operating, Note 2

Operating, Alarm Condition, Note 1

Low Battery or Failed Chamber

Test , No Alarm

Operating, Alarm Condition, Note 1

Low Battery or Failed Chamber

Test, No Alarm

At Conclusion of Local Alarm or

Test

From Start of Local Alarm to IO

Active

IO pulse width guaranteed to be

filtered. IO as Input, No Local

Alarm

No Local Alarm, From IO Active

Horn Active

Limits

Min Typ Max

9.4 10.5 11.5

9.4 10.5 11.5

38

43

47

.6

.67

.74

LED IS NOT ON

9.7 10.5 11.8

2.42 2.7 2.96

Units

mS

mS

S

S

S

S

S

1.21 1.33 1.47

S

1.21 1.33 1.47

S

9.7 10.5 11.8

S

336

mS

39

47

S

94

104 115

uS

227 252 277 mS

9.5 10.5 11.5 mS

76

84

92

mS

39

43

47

S

.91

1.46

S

0

S

600 mS

.75

1.65

S

Note 1 – See timing diagram for Horn Temporal Pattern

Note 2 - TPOSC and TON2 are 100% production tested. All other timing is guaranteed by functional testing.

Typical values are for design information and are not guaranteed.

Limits over the specified temperature range are not production tested and are based on characterization data.

© 2009 Microchip Technology Inc.

DS22178A-page 4

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