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RE46C190 데이터 시트보기 (PDF) - Microchip Technology

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RE46C190 Datasheet PDF : 42 Pages
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RE46C190
AC ELECTRICAL CHARACTERISTICS (CONTINUED)
AC Electrical Characteristics: Unless otherwise indicated, all parameters apply at TA = -10° to +60°C, VDD = 3V,
VBST = 4.2V, Typical Application (unless otherwise noted) (Note 1 to Note 4).
Parameter
Symbol Test Pin Min
Typ
Max
Units
Condition
Smoke Test Period
TPER0B
2
with Continuous Horn
Pattern
TPER1B
2
10
10.7
11.4
2.5
2.7
2.9
s
Standby, no alarm
s
Standby, after one valid
smoke sample
TPER2B
2
1.25
1.33
1.41
s
Standby,
after two consecutive
valid smoke samples
TPER3B
2
1.25
1.33
1.41
s
Local Alarm
(three consecutive valid
smoke samples)
TPER4B
2
TPER5B
2
Chamber Test Period TPCT1
2
Long Term Drift
Sample Period
TLTD
2
313
333
353
10
10.7
11.4
40
43
46
400
430
460
ms Push button test
s
In remote alarm
s
Standby, no alarm
s
Standby, no alarm
LTD enabled
Low Battery
Low Battery Sample TPLB1
3
Period
TPLB2
3
320
344
368
80
86
92
Horn Operation
Low Battery Horn
THPER1
13
40
43
46
Period
s
RLED on
s
RLED on
s
Low battery, no alarm
Chamber Fail Horn THPER2
13
40
43
46
Period
s
Chamber failure
Low Battery Horn
THON1
13
9.8
10.4
11.0
ms Low battery, no alarm
On Time
Chamber Fail Horn
THON2
13
9.8
10.4
11.0
ms Chamber failure
On Time
Chamber Fail
Off Time
THOF1
13
305
325
345
ms Failed chamber,
no alarm, 3x chirp option
Alarm On Time
THON2A
13
470
500
530
with Temporal Horn
Pattern
ms Local or remote alarm
(Note 1)
Alarm Off Time
THOF2A
13
470
500
530
with Temporal Horn
Pattern
THOF3A
13
1.4
1.5
1.6
ms Local or remote alarm
(Note 1)
s
Local or remote alarm
(Note 1)
Alarm On Time
THON2B
13
235
250
265
with Continuous
Horn Pattern
ms Local or remote alarm
(Note 1)
Alarm Off Time
THOF2B
13
78
83
88
ms Local or remote alarm
with Continuous
(Note 1)
Horn Pattern
Note 1: See timing diagram for Horn Pattern (Figure 5-2).
2: TPCLK and TIRON are 100% production tested. All other AC parameters are verified by functional testing.
3: Typical values are for design information only.
4: Limits over the specified temperature range are not production tested, and are based on characterization
data.
2010 Microchip Technology Inc.
DS22271A-page 9

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