S-8253AAA-T8T1GZ 데이터 시트보기 (PDF) - Seiko Instruments Inc
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S-8253AAA-T8T1GZ Datasheet PDF : 32 Pages
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Rev.3.7_00
BATTERY PROTECTION IC FOR 2-SERIAL OR 3-SERIAL-CELL PACK
S-8253A/B Series
2. Detection Delay Time
（1） S-8253AAA, S-8253AAB, S-8253AAC, S-8253AAD, S-8253AAE, S-8253AAF, S-8253AAG, S-8253BAA,
S-8253BAC,S-8253BAD, S-8253BAE, S-8253BAH
Table 7
Item
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent detection delay time 1
Overcurrent detection delay time 2
Overcurrent detection delay time 3
Symbol
tCU
tDL
tIOV1
tIOV2
tIOV3
Condition
－
－
－
－
－
Min.
Typ.
Max.
Unit
Test
Condition
Test
Circuit
0.92
1.15
1.38
s
3
1
115
144
173 ms
3
1
7.2
9
10.8 ms
4
1
3.6
4.5
5.4 ms
4
1
220
300
380
µs
4
1
（2） S-8253BAB, S-8253BAF, S-8253BAG, S-8253BAI
Table 8
Item
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent detection delay time 1
Overcurrent detection delay time 2
Overcurrent detection delay time 3
Symbol
tCU
tDL
tIOV1
tIOV2
tIOV3
Condition
－
－
－
－
－
Min.
Typ.
Max.
Unit
Test
Condition
Test
Circuit
0.92
1.15
1.38
s
3
1
115
144
173 ms
3
1
3.6
4.5
5.4 ms
4
1
0.89
1.1
1.4 ms
4
1
220
300
380
µs
4
1
（3） S-8253AAH
Item
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent detection delay time 1
Overcurrent detection delay time 2
Overcurrent detection delay time 3
Symbol
tCU
tDL
tIOV1
tIOV2
tIOV3
Table 9
Condition
Min.
Typ.
Max.
Unit
Test
Condition
Test
Circuit
－
0.92
1.15
1.38
s
3
1
－
115
144
173 ms
3
1
－
14.5
18
22
ms
4
1
－
3.6
4.5
5.4 ms
4
1
－
220
300
380
µs
4
1
Seiko Instruments Inc.
9
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