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SAA5254

Integrated VIP and teletext decoder (IVT1.1X)

Philips Electronics 

Philips Semiconductors

Integrated VIP and teletext decoder

(IVT1.1X)

Preliminary specification

SAA5254

QUALITY AND RELIABILITY

This device will meet Philips Semiconductors General Quality Specification for Business group “Consumer Integrated

Circuits SNW-FQ-611-Part E”. The principal requirements are shown in Tables 1 to 4.

Group A

Table 1 Acceptance tests per lot

Mechanical

Electrical

TEST

CONDITIONS

REQUIREMENTS(1)

cumulative target < 100 ppm

cumulative target < 100 ppm

Group B

Table 2 Processability tests (by package family)

TEST

Solderability

Mechanical

Solder heat resistance

CONDITIONS

REQUIREMENTS(1)

< 7% LTPD

< 15% LTPD

< 15% LTPD

Group C

Table 3 Reliability tests (by process family)

TEST

Operational life

CONDITIONS

168 hours at Tj = 150 °C

Humidity life

Temperature cycling performance

temperature, humidity, bias

(1000 hours, 85 °C, 85% RH or

equivalent test)

Tstg(min) to Tstg(max)

REQUIREMENTS(1)

< 1500 FPM; equivalent to

< 100 FITS at Tj = 70 °C

< 2000 FPM

< 2000 FPM

Table 4 Reliability tests (by device type)

TEST

ESD and latch-up

CONDITIONS

ESD Human body model

2000 V, 100 pF, 1.5 kΩ

ESD Machine model

200 V, 100 pF, 1.5 kΩ

latch-up 100 mA, 1.5 × VDD

(absolute maximum)

Notes to Tables 1 to 4

1. ppm = fraction of defective devices, in parts per million.

LTPD = Lot Tolerance Percent Defective.

FPM = fraction of devices failing at test condition, in Failures Per Million.

FITS = Failures In Time Standard.

REQUIREMENTS(1)

< 15% LTPD

< 15% LTPD

< 15% LTPD

1996 Nov 07

6

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