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SL432A 데이터 시트보기 (PDF) - AUK -> KODENSHI CORP

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SL432A
AUK
AUK -> KODENSHI CORP AUK
SL432A Datasheet PDF : 5 Pages
1 2 3 4 5
Fig. 1 Test circuit for VKA=Vref
Input
VKA
IK
Fig. 2 Test circuit for VKA>Vref
Input
VKA
R1
IK
Iref
R2
SL432x
Fig. 3 Test circuit for IK(off)
Input
VKA
IK(off)
V KA
=
Vref
×
Vref
(1 +
R
1
R2
)
+
I ref
× R1
Note.
1. Ambient temperature range: TLOW = -40, THigh = 85
2. The deviation parameters Vref and Iref are defined as the difference between the maximum value and minimum value
obtained over the full operating ambient temperature range that applied.
Vref = Vref Max – Vref Min
Ta = T2 – T1
Ambient Temperature
The average temperature coefficient of the reference input voltage, αVref is defined as:
(
Vref
×106 )
ppm
α Vref ( ) =
Vref (Ta = 25)
Ta
αVref can be positive or negative depending on whether Vref Min or Vref Max occurs at the lower ambient temperature, refer to
Fig. 8
Example : Vref = 10mV and the slope is positive,
Vref @ 25= 1.24V
Ta = 125
ppm
αVref ( ) =
( 0.010 ) ×106
1.241
125
= 65ppm /
3. The dynamic impedance ZKA is defined as:
Ζ KA
= VKA
I K
When the device is operating with two external resistors, R1 and R2, (refer to Fig.2) the total dynamic impedance of the circuit
is given by:
Ζ KA '
=
Ζ KA
× (1+ R1 )
R2
KSD-I0A001-002
3

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