SMP100LC-270(2000) 데이터 시트보기 (PDF) - STMicroelectronics

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SMP100LC-270
(Rev.:2000)

TRISIL™ FOR HIGH DEBIT RATE TELECOM LINES PROTECTION

STMicroelectronics 

Fig 5 : Variation of junction capacitance versus re-

verse voltage applied (typical values).

C [VR] / C [VR=50V]

2.5

2.0

1.5

1.0

0.5

0.0

1

2

VR(V)

5 10 20

50 100 200

SMP100LC-xxx

FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT 1 : GO-NO GO TEST

R

VBAT = - 48 V

D.U.T.

- VP

Surge generator

This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit.

TEST PROCEDURE :

- Adjust the current level at the IH value by short circuiting the D.U.T.

- Fire the D.U.T. with a surge current : Ipp = 10A, 10/1000 µs.

- The D.U.T. will come back to the off-state within 50 ms max.

5/8

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