MX29F800B 데이터 시트보기 (PDF) - Macronix International

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MX29F800B

8M-BIT [1Mx8/512Kx16] CMOS FLASH MEMORY

Macronix International 

MX29F800T/B

CAPACITANCE TA = 25oC, f = 1.0 MHz

SYMBOL PARAMETER

MIN. TYP MAX. UNIT

CIN1

Input Capacitance

8

pF

CIN2

Control Pin Capacitance

12

pF

COUT

Output Capacitance

12

pF

CONDITIONS

VIN = 0V

VIN = 0V

VOUT = 0V

READ OPERATION

DC CHARACTERISTICS TA = -40oC TO 85oC, VCC = 5V±10% (TA = 0oC TO 70oC for MX29F800T/B-70)

SYMBOL

ILI

ILO

ISB1

ISB2

ICC1

ICC2

VIL

VIH

VOL

VOH1

VOH2

PARAMETER

Input Leakage Current

Output Leakage Current

Standby VCC current

MIN.

Operating VCC current

Input Low Voltage

-0.3(NOTE 1)

Input High Voltage

2.0

Output Low Voltage

Output High Voltage(TTL)

2.4

Output High Voltage(CMOS) VCC-0.4

TYP MAX. UNIT

1

uA

±1

uA

1

mA

0.2

5

uA

30

mA

50

mA

0.8

V

VCC + 0.3 V

0.45

V

V

V

NOTES:

1.VIL min. = -1.0V for pulse width is equal to or less than 50 ns.

VIL min. = -2.0V for pulse width is equal to or less than 20 ns.

2.VIH max. = VCC + 1.5V for pulse width is equal to or less than 20 ns

If VIH is over the specified maximum value, read operation cannot be guaranteed.

CONDITIONS

VIN = GND to VCC

VOUT = GND to VCC

CE = VIH

CE = VCC + 0.3V

IOUT = 0mA, f=1MHz

IOUT= 0mA, f=10MHz

IOL = 2.1mA

IOH = -2mA

IOH = -100uA,

VCC=VCC MIN

AC CHARACTERISTICS TA = -40oC TO 85oC, VCC = 5V±10% (TA = 0oC TO 70oC for MX29F800T/B-70)

SYMBOL PARAMETER

tACC

Address to Output Delay

tCE

CE to Output Delay

tOE

OE to Output Delay

tDF

OE High to Output Float (Note1)

tOH

Address to Output hold

29F800T/B-70

MIN. MAX.

70

70

40

0

30

29F800T/B-90 29F800T/B-12

MIN. MAX. MIN. MAX. UNIT CONDITIONS

90

120 ns CE=OE=VIL

90

120 ns OE=VIL

40

50

ns CE=VIL

0

30

0 30

ns CE=VIL

ns CE=OE=VIL

TEST CONDITIONS:

• Input pulse levels: 0.45V/2.4V

• Input rise and fall times is equal to or less than 10ns

• Output load: 1 TTL gate + 100pF (Including scope and

jig)

• Reference levels for measuring timing: 0.8V, 2.0V

NOTE:

1. tDF is defined as the time at which the output achieves

the open circuit condition and data is no longer driven.

P/N:PM0578

REV. 1.7, JUL. 24, 2001

14

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